Schmitt, Axel K., Zack, Thomas (2012) High-sensitivity U–Pb rutile dating by secondary ion mass spectrometry (SIMS) with an O2+ primary beam. Chemical Geology, 332. 65-73 doi:10.1016/j.chemgeo.2012.09.023

Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | High-sensitivity U–Pb rutile dating by secondary ion mass spectrometry (SIMS) with an O2+ primary beam | ||
Journal | Chemical Geology | ||
Authors | Schmitt, Axel K. | Author | |
Zack, Thomas | Author | ||
Year | 2012 (November) | Volume | 332 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.chemgeo.2012.09.023Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 297325 | Long-form Identifier | mindat:1:5:297325:2 |
GUID | 0 | ||
Full Reference | Schmitt, Axel K., Zack, Thomas (2012) High-sensitivity U–Pb rutile dating by secondary ion mass spectrometry (SIMS) with an O2+ primary beam. Chemical Geology, 332. 65-73 doi:10.1016/j.chemgeo.2012.09.023 | ||
Plain Text | Schmitt, Axel K., Zack, Thomas (2012) High-sensitivity U–Pb rutile dating by secondary ion mass spectrometry (SIMS) with an O2+ primary beam. Chemical Geology, 332. 65-73 doi:10.1016/j.chemgeo.2012.09.023 | ||
In | (2012) Chemical Geology Vol. 332. Elsevier BV |
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