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Senda, K. (2005) X-ray Rietveld refinement and FTIR spectra of synthetic (Si,Ge)-richterites. American Mineralogist, 90 (7) 1062-1071 doi:10.2138/am.2005.1644

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Reference TypeJournal (article/letter/editorial)
TitleX-ray Rietveld refinement and FTIR spectra of synthetic (Si,Ge)-richterites
JournalAmerican Mineralogist
AuthorsSenda, K.Author
Year2005 (July 1)Volume90
Issue7
PublisherMineralogical Society of America
Download URLhttps://rruff.info/doclib/am/vol90/AM90_1062.pdf+
DOIdoi:10.2138/am.2005.1644Search in ResearchGate
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Mindat Ref. ID395311Long-form Identifiermindat:1:5:395311:6
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Full ReferenceSenda, K. (2005) X-ray Rietveld refinement and FTIR spectra of synthetic (Si,Ge)-richterites. American Mineralogist, 90 (7) 1062-1071 doi:10.2138/am.2005.1644
Plain TextSenda, K. (2005) X-ray Rietveld refinement and FTIR spectra of synthetic (Si,Ge)-richterites. American Mineralogist, 90 (7) 1062-1071 doi:10.2138/am.2005.1644
In(2005, July) American Mineralogist Vol. 90 (7) Mineralogical Society of America

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