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Ishida, K., Hawthorne, F. C. (2011) Far-infrared spectra of synthetic [4][(Al2-xGax)(Si2-yGey)](OH,OD,F)2-kinoshitalite: Characterization and assignment of interlayer Ba-Oinner and Ba-Oouter stretching bands. American Mineralogist, 96 (4) 566-576 doi:10.2138/am.2011.3626

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Reference TypeJournal (article/letter/editorial)
TitleFar-infrared spectra of synthetic [4][(Al2-xGax)(Si2-yGey)](OH,OD,F)2-kinoshitalite: Characterization and assignment of interlayer Ba-Oinner and Ba-Oouter stretching bands
JournalAmerican Mineralogist
AuthorsIshida, K.Author
Hawthorne, F. C.Author
Year2011 (April 1)Volume96
Issue4
PublisherMineralogical Society of America
DOIdoi:10.2138/am.2011.3626Search in ResearchGate
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Mindat Ref. ID396716Long-form Identifiermindat:1:5:396716:8
GUID0
Full ReferenceIshida, K., Hawthorne, F. C. (2011) Far-infrared spectra of synthetic [4][(Al2-xGax)(Si2-yGey)](OH,OD,F)2-kinoshitalite: Characterization and assignment of interlayer Ba-Oinner and Ba-Oouter stretching bands. American Mineralogist, 96 (4) 566-576 doi:10.2138/am.2011.3626
Plain TextIshida, K., Hawthorne, F. C. (2011) Far-infrared spectra of synthetic [4][(Al2-xGax)(Si2-yGey)](OH,OD,F)2-kinoshitalite: Characterization and assignment of interlayer Ba-Oinner and Ba-Oouter stretching bands. American Mineralogist, 96 (4) 566-576 doi:10.2138/am.2011.3626
In(2011, April) American Mineralogist Vol. 96 (4) Mineralogical Society of America


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