Reference Type | Journal (article/letter/editorial) |
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Title | High resolution DC size effect measurement of resistivity in aluminium up to 30K using RF squid and HTSC wiring |
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Journal | Physica B: Condensed Matter |
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Authors | Romero, José | Author |
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Fleischer, Thomas | Author |
Huguenin, Robert | Author |
Year | 1990 (August) | Volume | 165 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0921-4526(90)80921-5Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4041702 | Long-form Identifier | mindat:1:5:4041702:4 |
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GUID | 0 |
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Full Reference | Romero, José, Fleischer, Thomas, Huguenin, Robert (1990) High resolution DC size effect measurement of resistivity in aluminium up to 30K using RF squid and HTSC wiring. Physica B: Condensed Matter, 165. 143-144 doi:10.1016/s0921-4526(90)80921-5 |
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Plain Text | Romero, José, Fleischer, Thomas, Huguenin, Robert (1990) High resolution DC size effect measurement of resistivity in aluminium up to 30K using RF squid and HTSC wiring. Physica B: Condensed Matter, 165. 143-144 doi:10.1016/s0921-4526(90)80921-5 |
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In | (1990) Physica B: Condensed Matter Vol. 165. Elsevier BV |
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