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Ohashi, M., Sawabu, M., Nakanishi, H., Ohashi, K., Maeta, K. (2018) Electrical and structural properties of epitaxially deposited chromium thin films. Physica B: Condensed Matter, 536. 790-792 doi:10.1016/j.physb.2017.10.040

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Reference TypeJournal (article/letter/editorial)
TitleElectrical and structural properties of epitaxially deposited chromium thin films
JournalPhysica B: Condensed Matter
AuthorsOhashi, M.Author
Sawabu, M.Author
Nakanishi, H.Author
Ohashi, K.Author
Maeta, K.Author
Year2018 (May)Volume536
PublisherElsevier BV
DOIdoi:10.1016/j.physb.2017.10.040Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4073730Long-form Identifiermindat:1:5:4073730:8
GUID0
Full ReferenceOhashi, M., Sawabu, M., Nakanishi, H., Ohashi, K., Maeta, K. (2018) Electrical and structural properties of epitaxially deposited chromium thin films. Physica B: Condensed Matter, 536. 790-792 doi:10.1016/j.physb.2017.10.040
Plain TextOhashi, M., Sawabu, M., Nakanishi, H., Ohashi, K., Maeta, K. (2018) Electrical and structural properties of epitaxially deposited chromium thin films. Physica B: Condensed Matter, 536. 790-792 doi:10.1016/j.physb.2017.10.040
In(2018) Physica B: Condensed Matter Vol. 536. Elsevier BV

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