Kita, Tomoyuki, Nishimoto, Shunsuke, Kameshima, Yoshikazu, Miyake, Michihiro (2010) Characterization of Silicon Oxide Nanowires Prepared by Hydrothermal Treatment Using Slow Dissolution of Bulk Glass Source Materials. Journal of the American Ceramic Society, 93 (9). 2427-2429 doi:10.1111/j.1551-2916.2010.03761.x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characterization of Silicon Oxide Nanowires Prepared by Hydrothermal Treatment Using Slow Dissolution of Bulk Glass Source Materials | ||
Journal | Journal of the American Ceramic Society | ||
Authors | Kita, Tomoyuki | Author | |
Nishimoto, Shunsuke | Author | ||
Kameshima, Yoshikazu | Author | ||
Miyake, Michihiro | Author | ||
Year | 2010 (April 15) | Volume | 93 |
Issue | 9 | ||
Publisher | Wiley | ||
DOI | doi:10.1111/j.1551-2916.2010.03761.xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4101259 | Long-form Identifier | mindat:1:5:4101259:8 |
GUID | 0 | ||
Full Reference | Kita, Tomoyuki, Nishimoto, Shunsuke, Kameshima, Yoshikazu, Miyake, Michihiro (2010) Characterization of Silicon Oxide Nanowires Prepared by Hydrothermal Treatment Using Slow Dissolution of Bulk Glass Source Materials. Journal of the American Ceramic Society, 93 (9). 2427-2429 doi:10.1111/j.1551-2916.2010.03761.x | ||
Plain Text | Kita, Tomoyuki, Nishimoto, Shunsuke, Kameshima, Yoshikazu, Miyake, Michihiro (2010) Characterization of Silicon Oxide Nanowires Prepared by Hydrothermal Treatment Using Slow Dissolution of Bulk Glass Source Materials. Journal of the American Ceramic Society, 93 (9). 2427-2429 doi:10.1111/j.1551-2916.2010.03761.x | ||
In | (2010, April) Journal of the American Ceramic Society Vol. 93 (9) Wiley |
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