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Nagata, S., Tsuchiya, B., Sugawara, T., Ohtsu, N., Shikama, T. (2002) Helium and hydrogen trapping in W and Mo single-crystals irradiated by He ions. Journal of Nuclear Materials, 307. 1513-1516 doi:10.1016/s0022-3115(02)01269-2

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Reference TypeJournal (article/letter/editorial)
TitleHelium and hydrogen trapping in W and Mo single-crystals irradiated by He ions
JournalJournal of Nuclear Materials
AuthorsNagata, S.Author
Tsuchiya, B.Author
Sugawara, T.Author
Ohtsu, N.Author
Shikama, T.Author
Year2002 (December)Volume307
PublisherElsevier BV
DOIdoi:10.1016/s0022-3115(02)01269-2Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4156227Long-form Identifiermindat:1:5:4156227:9
GUID0
Full ReferenceNagata, S., Tsuchiya, B., Sugawara, T., Ohtsu, N., Shikama, T. (2002) Helium and hydrogen trapping in W and Mo single-crystals irradiated by He ions. Journal of Nuclear Materials, 307. 1513-1516 doi:10.1016/s0022-3115(02)01269-2
Plain TextNagata, S., Tsuchiya, B., Sugawara, T., Ohtsu, N., Shikama, T. (2002) Helium and hydrogen trapping in W and Mo single-crystals irradiated by He ions. Journal of Nuclear Materials, 307. 1513-1516 doi:10.1016/s0022-3115(02)01269-2
In(2002) Journal of Nuclear Materials Vol. 307. Elsevier BV

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Nagata, S., Tsuchiya, B., Ohtsu, N., Sugawara, T., Shikama, T., Tokunaga, K., Takenaka, M., Kuramoto, E. (2003) Hydrogen and deuterium uptake in helium implanted layer of Mo and W. Journal of Nuclear Materials, 313. 279-283 doi:10.1016/s0022-3115(02)01581-7
Nagata, S., Tokunaga, K., Tsuchiya, B., Ohtsu, N., Sugawara, T., Shikama, T. (2003) Hydrogen accumulation in the helium implanted surface of Mo single crystals. Journal of Alloys and Compounds, 356. 326-329 doi:10.1016/s0925-8388(02)01276-8
Nagata, S., Tsuchiya, B., Sugawara, T., Ohtsu, N., Shikama, T. (2002) Ion beam analysis of helium and its irradiation effect on hydrogen trapping in W single crystals. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 190 (1). 652-656 doi:10.1016/s0168-583x(01)01242-3
Tsuchiya, B., Morita, K., Yamamoto, S., Nagata, S., Ohtsu, N., Shikama, T., Naramoto, H. (2003) Re-emission of hydrogen implanted into graphite by helium ion bombardment. Journal of Nuclear Materials, 313. 274-278 doi:10.1016/s0022-3115(02)01341-7
Mukouda, I., Shimomura, Y., Yamaki, D., Nakazawa, T., Aruga, T., Jitsukawa, S. (2002) Microstructure in vanadium irradiated by simultaneous multi-ion beam of hydrogen, helium and nickel ions. Journal of Nuclear Materials, 307. 412-415 doi:10.1016/s0022-3115(02)01081-4
Fujitsuka, M., Mutoh, I., Tanabe, T., Tsuchiya, B., Narui, M., Shikama, T., Sato, M. (2002) Change of thermal diffusivity and lattice constants of W–5% Re–HfC alloys irradiated in a fission reactor. Journal of Nuclear Materials, 307. 426-430 doi:10.1016/s0022-3115(02)01099-1
Ishizaki, T., Xu, Q., Yoshiie, T., Nagata, S., Troev, T. (2002) The effect of hydrogen and helium on microvoid formation in iron and nickel. Journal of Nuclear Materials, 307. 961-965 doi:10.1016/s0022-3115(02)01279-5
Katsui, H., Nagata, S., Tsuchiya, B., Zhao, M., Shikama, T. (2011) Damage and deuterium retention in LiAlO2 single crystals irradiated with deuterium ions using ion-beam techniques and optical absorption measurements. Journal of Nuclear Materials, 417 (1). 753-755 doi:10.1016/j.jnucmat.2010.12.134
Katsui, H., Nagata, S., Tsuchiya, B., Shikama, T. (2010) Study on damage accumulation in single crystal irradiated with deuterium and helium ions by ion-channeling. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268 (17). 2735-2739 doi:10.1016/j.nimb.2010.06.021
Nagata, S, Yamamoto, S, Toh, K, Tsuchiya, B, Ohtsu, N, Shikama, T, Naramoto, H (2004) Luminescence in SiO2 induced by MeV energy proton irradiation. Journal of Nuclear Materials, 329. 1507-1510 doi:10.1016/j.jnucmat.2004.04.242
Ishihara, M., Baba, S., Hoshiya, T., Shikama, T. (2002) Irradiation effects on thermal expansion of SiC/SiC composite materials. Journal of Nuclear Materials, 307. 1168-1172 doi:10.1016/s0022-3115(02)01056-5
 
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