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Vogt, Bryan D., Pai, Rajaram A., Lee, Hae-Jeong, Hedden, Ronald C., Soles, Christopher L., Wu, Wen-li, Lin, Eric K., Bauer, Barry J., Watkins, James J. (2005) Characterization of Ordered Mesoporous Silica Films Using Small-Angle Neutron Scattering and X-ray Porosimetry. Chemistry of Materials, 17. 1398-1408 doi:10.1021/cm048654k

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of Ordered Mesoporous Silica Films Using Small-Angle Neutron Scattering and X-ray Porosimetry
JournalChemistry of Materials
AuthorsVogt, Bryan D.Author
Pai, Rajaram A.Author
Lee, Hae-JeongAuthor
Hedden, Ronald C.Author
Soles, Christopher L.Author
Wu, Wen-liAuthor
Lin, Eric K.Author
Bauer, Barry J.Author
Watkins, James J.Author
Year2005 (March)Volume17
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/cm048654kSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4300627Long-form Identifiermindat:1:5:4300627:2
GUID0
Full ReferenceVogt, Bryan D., Pai, Rajaram A., Lee, Hae-Jeong, Hedden, Ronald C., Soles, Christopher L., Wu, Wen-li, Lin, Eric K., Bauer, Barry J., Watkins, James J. (2005) Characterization of Ordered Mesoporous Silica Films Using Small-Angle Neutron Scattering and X-ray Porosimetry. Chemistry of Materials, 17. 1398-1408 doi:10.1021/cm048654k
Plain TextVogt, Bryan D., Pai, Rajaram A., Lee, Hae-Jeong, Hedden, Ronald C., Soles, Christopher L., Wu, Wen-li, Lin, Eric K., Bauer, Barry J., Watkins, James J. (2005) Characterization of Ordered Mesoporous Silica Films Using Small-Angle Neutron Scattering and X-ray Porosimetry. Chemistry of Materials, 17. 1398-1408 doi:10.1021/cm048654k
In(2005) Chemistry of Materials Vol. 17. American Chemical Society (ACS)

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Hedden, Ronald C., Lee, Hae-Jeong, Soles, Christopher L., Bauer, Barry J. (2004) Characterization of Pore Structure in a Nanoporous Low-Dielectric-Constant Thin Film by Neutron Porosimetry and X-ray Porosimetry. Langmuir, 20. 6658-6667 doi:10.1021/la036334u
Lee, Hae-Jeong, Soles, Christopher L., Liu, Da-Wei, Bauer, Barry J., Lin, Eric K., Wu, Wen-li, Grill, Alfred (2004) Structural characterization of porous low-kthin films prepared by different techniques using x-ray porosimetry. Journal of Applied Physics, 95 (5). 2355-2359 doi:10.1063/1.1641955
Hedden, Ronald C., Lee, Hae-Jeong, Bauer, Barry J. (2004) Characterization of Nanoporous Low-kThin Films by Small-Angle Neutron Scattering Contrast Variation. Langmuir, 20. 416-422 doi:10.1021/la035384w
Vogt, Bryan D., Lee, Hae-Jeong, Wu, Wen-li, Liu, Youfan (2005) Specular X-ray Reflectivity and Small Angle Neutron Scattering for Structure Determination of Ordered Mesoporous Dielectric Films. The Journal of Physical Chemistry B, 109 (39). 18445-18450 doi:10.1021/jp0525641
Vogt, Bryan D., Soles, Christopher L., Lee, Hae-Jeong, Lin, Eric K., Wu, Wen-li (2004) Moisture Absorption and Absorption Kinetics in Polyelectrolyte Films:  Influence of Film Thickness. Langmuir, 20. 1453-1458 doi:10.1021/la035239i
Lee, Hae-Jeong, Lin, Eric K., Bauer, Barry J., Wu, Wen-li, Hwang, Byung Keun, Gray, William D. (2003) Characterization of chemical-vapor-deposited low-k thin films using x-ray porosimetry. Applied Physics Letters, 82 (7). 1084-1086 doi:10.1063/1.1553996
Lee, Hae-Jeong, Soles, Christopher L., Liu, Da-Wei, Bauer, Barry J., Wu, Wen-Li (2002) Pore size distributions in low-k dielectric thin films from X-ray porosimetry. Journal of Polymer Science Part B: Polymer Physics, 40 (19). 2170-2177 doi:10.1002/polb.10275
Lee, Hae-Jeong, Soles, Christopher L., Lin, Eric K., Wu, Wen-li, Liu, Youfan (2007) Nonuniform structural degradation in porous organosilicate films exposed to plasma, etching, and ashing as characterized by x-ray porosimetry. Applied Physics Letters, 91 (17). 172908pp. doi:10.1063/1.2800376
Lee, Hae-Jeong, Soles, Christopher L., Vogt, Bryan D., Liu, Da-Wei, Wu, Wen-li, Lin, Eric K., Kim, Ho-Cheol, Lee, Victor Y., Volksen, Willi, Miller, Robert D. (2008) Effect of Porogen Molecular Architecture and Loading on Structure of Porous Thin Films. Chemistry of Materials, 20. 7390-7398 doi:10.1021/cm800872b
Peng, Hua-Gen, Daga, Vikram K., Lin, Ying, Watkins, James J., Wu, Wen-Li, Soles, Christopher L. (2015) Distributions of a Linear Homopolymer Additive in an Ordered Block Copolymer Matrix As Quantified by Small-Angle Neutron Scattering. Macromolecules, 48. 7574-7584 doi:10.1021/acs.macromol.5b01163
Lee, Hae-Jeong, Soles, Christopher L., Ro, Hyun Wook, Jones, Ronald L., Lin, Eric K., Wu, Wen-li, Hines, Daniel R. (2005) Nanoimprint pattern transfer quality from specular x-ray reflectivity. Applied Physics Letters, 87 (26). 263111pp. doi:10.1063/1.2158512
 
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