Etinger-Geller, Yael, Katsman, Alex, Pokroy, Boaz (2017) Density of Nanometrically Thin Amorphous Films Varies by Thickness. Chemistry of Materials, 29. 4912-4919 doi:10.1021/acs.chemmater.7b01139
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Density of Nanometrically Thin Amorphous Films Varies by Thickness | ||
Journal | Chemistry of Materials | ||
Authors | Etinger-Geller, Yael | Author | |
Katsman, Alex | Author | ||
Pokroy, Boaz | Author | ||
Year | 2017 (June 13) | Volume | 29 |
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/acs.chemmater.7b01139Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4310377 | Long-form Identifier | mindat:1:5:4310377:9 |
GUID | 0 | ||
Full Reference | Etinger-Geller, Yael, Katsman, Alex, Pokroy, Boaz (2017) Density of Nanometrically Thin Amorphous Films Varies by Thickness. Chemistry of Materials, 29. 4912-4919 doi:10.1021/acs.chemmater.7b01139 | ||
Plain Text | Etinger-Geller, Yael, Katsman, Alex, Pokroy, Boaz (2017) Density of Nanometrically Thin Amorphous Films Varies by Thickness. Chemistry of Materials, 29. 4912-4919 doi:10.1021/acs.chemmater.7b01139 | ||
In | (2017) Chemistry of Materials Vol. 29. American Chemical Society (ACS) |
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