Reference Type | Journal (article/letter/editorial) |
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Title | Spectrographic analysis of semiconductor silicon and germanium with a hollow cathode discharge |
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Journal | Journal of Applied Spectroscopy |
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Authors | Rudnevskii, N. K. | Author |
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Maksimov, D. E. | Author |
Tumanova, A. N. | Author |
Shabanova, T. M. | Author |
Year | 1982 (November) | Volume | 37 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf00661009Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4434622 | Long-form Identifier | mindat:1:5:4434622:9 |
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GUID | 0 |
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Full Reference | Rudnevskii, N. K., Maksimov, D. E., Tumanova, A. N., Shabanova, T. M. (1982) Spectrographic analysis of semiconductor silicon and germanium with a hollow cathode discharge. Journal of Applied Spectroscopy, 37. 1219-1221 doi:10.1007/bf00661009 |
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Plain Text | Rudnevskii, N. K., Maksimov, D. E., Tumanova, A. N., Shabanova, T. M. (1982) Spectrographic analysis of semiconductor silicon and germanium with a hollow cathode discharge. Journal of Applied Spectroscopy, 37. 1219-1221 doi:10.1007/bf00661009 |
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In | (1982) Journal of Applied Spectroscopy Vol. 37. Springer Science and Business Media LLC |
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