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Schapink, F. W. (1975) Symmetry of dislocation images in transmission electron microscopy. Journal of Applied Crystallography, 8 (2) 220 doi:10.1107/s0021889875010266

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Reference TypeJournal (article/letter/editorial)
TitleSymmetry of dislocation images in transmission electron microscopy
JournalJournal of Applied Crystallography
AuthorsSchapink, F. W.Author
Year1975 (April 1)Volume8
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889875010266Search in ResearchGate
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Mindat Ref. ID465110Long-form Identifiermindat:1:5:465110:3
GUID0
Full ReferenceSchapink, F. W. (1975) Symmetry of dislocation images in transmission electron microscopy. Journal of Applied Crystallography, 8 (2) 220 doi:10.1107/s0021889875010266
Plain TextSchapink, F. W. (1975) Symmetry of dislocation images in transmission electron microscopy. Journal of Applied Crystallography, 8 (2) 220 doi:10.1107/s0021889875010266
In(1975, April) Journal of Applied Crystallography Vol. 8 (2) International Union of Crystallography (IUCr)

See Also

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Schapink, F. W. (1973) Complementary Dark Field Dislocation Images in Transmission Electron Microscopy. physica status solidi (b), 56 (2). doi:10.1002/pssb.2220560245
Schapink, F. W. (1972) Complementary Images of a Stacking Fault in Transmission Electron Microscopy. physica status solidi (b), 53 (1). doi:10.1002/pssb.2220530144
Howie, A. (1975) Theoretical basis of diffraction contrast of lattice imperfections in transmission electron microscopy. Journal of Applied Crystallography, 8 (2) 212-213 doi:10.1107/s0021889875010242
Rühle, M. (1975) Diffraction contrast of small point-defect agglomerates as studied by transmission electron microscopy (TEM) Journal of Applied Crystallography, 8 (2) 223 doi:10.1107/s0021889875010308
Blom, N. S., Schapink, F. W. (1985) Computer simulation of convergent-beam electron diffraction patterns from bicrystals. Journal of Applied Crystallography, 18 (2) 126-130 doi:10.1107/s0021889885009955
Schapink, F. W., Forghany, S. K. E., Buxton, B. F. (1984) The symmetry of convergent-beam electron diffraction patterns from bicrystals: erratum. Acta Crystallographica Section A Foundations of Crystallography, 40 (2). 167 doi:10.1107/s0108767384000374
Cowley, J. M. (1975) Electron-diffraction and electron-microscopy methods for the study of ordering in crystals. Journal of Applied Crystallography, 8 (2) 204 doi:10.1107/s0021889875010175
DeWit, Roland (1965) Displacement of Dislocation Images formed in Transmission Electron Microscopy. Journal of Applied Physics, 36 (1). 329-330 doi:10.1063/1.1713911
Lannes, A. (1975) On some integral aspects of the dynamical theory of electron diffraction. Journal of Applied Crystallography, 8 (2) 220-221 doi:10.1107/s0021889875010278
Schapink, F. W., Forghany, S. K. E., Buxton, B. F. (1983) The symmetry of convergent-beam electron diffraction patterns from bicrystals. Acta Crystallographica Section A Foundations of Crystallography, 39 (5). 805-813 doi:10.1107/s0108767383001580
Lin, F., Chen, Q., Peng, L.-M. (2007) REW– exit-wave reconstruction and alignments for focus-variation high-resolution transmission electron microscopy images. Journal of Applied Crystallography, 40 (3). 614 doi:10.1107/s0021889807008588
 
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