Cherqui, Charles, Thakkar, Niket, Li, Guoliang, Camden, Jon P., Masiello, David J. (2016) Characterizing Localized Surface Plasmons Using Electron Energy-Loss Spectroscopy. Annual Review of Physical Chemistry, 67. 331-357 doi:10.1146/annurev-physchem-040214-121612
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterizing Localized Surface Plasmons Using Electron Energy-Loss Spectroscopy | ||
| Journal | Annual Review of Physical Chemistry | ||
| Authors | Cherqui, Charles | Author | |
| Thakkar, Niket | Author | ||
| Li, Guoliang | Author | ||
| Camden, Jon P. | Author | ||
| Masiello, David J. | Author | ||
| Year | 2016 (May 27) | Volume | 67 |
| Publisher | Annual Reviews | ||
| DOI | doi:10.1146/annurev-physchem-040214-121612Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4663934 | Long-form Identifier | mindat:1:5:4663934:5 |
| GUID | 0 | ||
| Full Reference | Cherqui, Charles, Thakkar, Niket, Li, Guoliang, Camden, Jon P., Masiello, David J. (2016) Characterizing Localized Surface Plasmons Using Electron Energy-Loss Spectroscopy. Annual Review of Physical Chemistry, 67. 331-357 doi:10.1146/annurev-physchem-040214-121612 | ||
| Plain Text | Cherqui, Charles, Thakkar, Niket, Li, Guoliang, Camden, Jon P., Masiello, David J. (2016) Characterizing Localized Surface Plasmons Using Electron Energy-Loss Spectroscopy. Annual Review of Physical Chemistry, 67. 331-357 doi:10.1146/annurev-physchem-040214-121612 | ||
| In | (2016) Annual Review of Physical Chemistry Vol. 67. Annual Reviews | ||
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