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Vetter, W. M., Dudley, M. (1998) Harmonic composition of synchrotron white-beam X-ray topographic back-reflection images of basal-cut silicon carbide single-crystal wafers. Journal of Applied Crystallography, 31 (5). 820-822 doi:10.1107/s0021889898004683

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Reference TypeJournal (article/letter/editorial)
TitleHarmonic composition of synchrotron white-beam X-ray topographic back-reflection images of basal-cut silicon carbide single-crystal wafers
JournalJournal of Applied Crystallography
AuthorsVetter, W. M.Author
Dudley, M.Author
Year1998 (October 1)Volume31
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889898004683Search in ResearchGate
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Mindat Ref. ID4665488Long-form Identifiermindat:1:5:4665488:5
GUID0
Full ReferenceVetter, W. M., Dudley, M. (1998) Harmonic composition of synchrotron white-beam X-ray topographic back-reflection images of basal-cut silicon carbide single-crystal wafers. Journal of Applied Crystallography, 31 (5). 820-822 doi:10.1107/s0021889898004683
Plain TextVetter, W. M., Dudley, M. (1998) Harmonic composition of synchrotron white-beam X-ray topographic back-reflection images of basal-cut silicon carbide single-crystal wafers. Journal of Applied Crystallography, 31 (5). 820-822 doi:10.1107/s0021889898004683
In(1998, October) Journal of Applied Crystallography Vol. 31 (5) International Union of Crystallography (IUCr)

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Vetter, W. M., Dudley, M. (2004) The contrast of inclusions compared with that of micropipes in back-reflection synchrotron white-beam topographs of SiC. Journal of Applied Crystallography, 37 (2). 200-203 doi:10.1107/s0021889803028553
Vetter, W. M., Tsuchida, H., Kamata, I., Dudley, M. (2005) Simulation of threading dislocation images in X-ray topographs of silicon carbide homo-epilayers. Journal of Applied Crystallography, 38 (3). 442-447 doi:10.1107/s0021889805005819
Vetter, W. M., Dudley, M. (2002) Surface-relaxation contributions to axial screw dislocation contrast in synchrotron white-beam X-ray topographs of SiC. Journal of Applied Crystallography, 35 (6). 689-695 doi:10.1107/s0021889802016175
Vetter, W. M., Dudley, M. (2001) X-ray topographic dislocation contrast visible in reflections orthogonal to the Burgers vectors of axial screw dislocations in hexagonal silicon carbide. Journal of Applied Crystallography, 34 (1). 20-26 doi:10.1107/s0021889800017027
Vetter, W. M., Gallagher, D. T., Dudley, M. (2002) Synchrotron white-beam X-ray topography of ribonuclease S crystals. Acta Crystallographica Section D Biological Crystallography, 58 (4). 579-584 doi:10.1107/s090744490200121x
Huang, X. R., Dudley, M., Vetter, W. M., Huang, W., Si, W., Carter Jr, C. H. (1999) Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image. Journal of Applied Crystallography, 32 (3). 516-524 doi:10.1107/s0021889899002939
Vetter, William M, Huang, Wei, Neudeck, Philip, Powell, J.Anthony, Dudley, Michael (2001) Synchrotron white-beam topographic studies of 2H–SiC crystals. Journal of Crystal Growth, 224 (3). 269-273 doi:10.1016/s0022-0248(01)00971-x
Thiel, Daniel J. (1998) Ray-tracing analysis of capillary concentrators for macromolecular crystallography. Journal of Synchrotron Radiation, 5 (3). 820-822 doi:10.1107/s0909049597035607
Chen, Y., Dhanaraj, G., Dudley, M., Sanchez, E. K., MacMillan, M. F. (2007) Sense determination of micropipes via grazing-incidence synchrotron white beam x-ray topography in 4H silicon carbide. Applied Physics Letters, 91 (7). 71917pp. doi:10.1063/1.2772190
Kimura, Shigeru, Matsumura, Tatsuya, Kinoshita, Katsuyuki, Hirano, Keiichi, Kihara, Hiroshi (1998) High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube. Journal of Synchrotron Radiation, 5 (3). 1079-1081 doi:10.1107/s0909049597014258
Fukuda, K., Yoshida, T., Shimura, T., Umeno, M., Iida, S. (2002) X-ray topographic observations of bonded silicon-on-insulator wafers using synchrotron radiation. Acta Crystallographica Section A Foundations of Crystallography, 58. doi:10.1107/s0108767302091870
 
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