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Müller, E. W., Nishikawa, O. (1965) Increased Image Brightness in a Field Ion Microscope. Review of Scientific Instruments, 36 (4). 556 doi:10.1063/1.1719629

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Reference TypeJournal (article/letter/editorial)
TitleIncreased Image Brightness in a Field Ion Microscope
JournalReview of Scientific Instruments
AuthorsMüller, E. W.Author
Nishikawa, O.Author
Year1965 (April)Volume36
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.1719629Search in ResearchGate
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Mindat Ref. ID4803764Long-form Identifiermindat:1:5:4803764:8
GUID0
Full ReferenceMüller, E. W., Nishikawa, O. (1965) Increased Image Brightness in a Field Ion Microscope. Review of Scientific Instruments, 36 (4). 556 doi:10.1063/1.1719629
Plain TextMüller, E. W., Nishikawa, O. (1965) Increased Image Brightness in a Field Ion Microscope. Review of Scientific Instruments, 36 (4). 556 doi:10.1063/1.1719629
In(1965, April) Review of Scientific Instruments Vol. 36 (4) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Müller, Erwin W. (1966) Increased Image Brightness by Immersion of a Field Ion Microscope. Journal of Applied Physics, 37 (13). 5001-5002 doi:10.1063/1.1708186
McLane, S. B., Müller, E. W., Nishikawa, O. (1964) Field Ion Microscopy with an External Image Intensifier. Review of Scientific Instruments, 35 (10). 1297-1302 doi:10.1063/1.1718728
Gomer, Robert, Feldman, Uri (1966) Comment on ``Increased Image Brightness by Immersion of a Field Ion Microscope,'' by E. W. Müller. Journal of Applied Physics, 37 (13). 5002 doi:10.1063/1.1708187
Pimbley, W. T., Ball, R. M. (1965) Use of a Refrigerator with the Field Ion Microscope. Review of Scientific Instruments, 36 (2). 225-226 doi:10.1063/1.1719527
Müller, E. W., Nakamura, S., Nishikawa, O., McLane, S. B. (1965) Gas‐Surface Interactions and Field‐Ion Microscopy of Nonrefractory Metals. Journal of Applied Physics, 36 (8). 2496-2503 doi:10.1063/1.1714519
Nakamura, Shogo, Müller, Erwin W. (1965) Initial Oxidation of Tantalum Observed in a Field Ion Microscope. Journal of Applied Physics, 36 (11). 3634-3641 doi:10.1063/1.1703057
Nishikawa, Osamu, Müller, E. W. (1964) Operation of the Field Ion Microscope with Neon. Journal of Applied Physics, 35 (10). 2806-2812 doi:10.1063/1.1713112
Hartman, A. W. (1965) Scanning Microscope Densitometer. Review of Scientific Instruments, 36 (1). 31-34 doi:10.1063/1.1719318
Müller, Erwin W., Panitz, John A., McLane, S. Brooks (1968) The Atom‐Probe Field Ion Microscope. Review of Scientific Instruments, 39 (1). 83-86 doi:10.1063/1.1683116
Caruso, A. J., Neupert, W. M. (1965) Multiple Element Soft X‐Ray Source. Review of Scientific Instruments, 36 (4). 554-556 doi:10.1063/1.1719628
Weizer, Victor G. (1965) Variable‐Potential Image Intensification in the Field‐Ion Microscope. Journal of Applied Physics, 36 (6). 2090-2091 doi:10.1063/1.1714419
 
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