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Tsong, T. T., McLane, S. B., Kinkus, T. J. (1982) Pulsed‐laser time‐of‐flight atom‐probe field ion microscope. Review of Scientific Instruments, 53 (9). 1442-1448 doi:10.1063/1.1137193

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Reference TypeJournal (article/letter/editorial)
TitlePulsed‐laser time‐of‐flight atom‐probe field ion microscope
JournalReview of Scientific Instruments
AuthorsTsong, T. T.Author
McLane, S. B.Author
Kinkus, T. J.Author
Year1982 (September)Volume53
Issue9
PublisherAIP Publishing
DOIdoi:10.1063/1.1137193Search in ResearchGate
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Mindat Ref. ID4837166Long-form Identifiermindat:1:5:4837166:7
GUID0
Full ReferenceTsong, T. T., McLane, S. B., Kinkus, T. J. (1982) Pulsed‐laser time‐of‐flight atom‐probe field ion microscope. Review of Scientific Instruments, 53 (9). 1442-1448 doi:10.1063/1.1137193
Plain TextTsong, T. T., McLane, S. B., Kinkus, T. J. (1982) Pulsed‐laser time‐of‐flight atom‐probe field ion microscope. Review of Scientific Instruments, 53 (9). 1442-1448 doi:10.1063/1.1137193
In(1982, September) Review of Scientific Instruments Vol. 53 (9) AIP Publishing

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Tsong, T. T., Liou, Y., McLane, S. B. (1984) Methods for a precision measurement of ionic masses and appearance energies using the pulsed‐laser time‐of‐flight atom probe. Review of Scientific Instruments, 55 (8). 1246-1254 doi:10.1063/1.1137930
Ren, Duomin, Tsong, T. T., McLane, S. B. (1986) Method for an accurate calibration of the flight‐time‐focused time‐of‐flight atom probe. Review of Scientific Instruments, 57 (10). 2543-2546 doi:10.1063/1.1139108
Tsong, T. T., Kinkus, T. J., Ai, C. F. (1983) Field induced and surface catalyzed formation of novel ions : A pulsed‐laser time‐of‐flight atom‐probe study. The Journal of Chemical Physics, 78 (7) 4763-4775 doi:10.1063/1.445276
Tsong, T. T., Kinkus, T. J., McLane, S. B. (1983) Pulsed‐laser stimulated field desorption of gas molecules and field evaporation of metal atoms. The Journal of Chemical Physics, 78 (12) 7497-7498 doi:10.1063/1.444707
Liu, H. F., Tsong, T. T. (1984) Numerical calculation of the temperature evolution and profile of the field ion emitter in the pulsed‐laser time‐of‐flight atom probe. Review of Scientific Instruments, 55 (11). 1779-1784 doi:10.1063/1.1137658
Tsong, T. T., McLane, S. B., Ahmad, M., Wu, C. S. (1982) Field evaporation events as Markov chains: A time‐of‐flight atom‐probe study of iridium, Pt‐Rh alloys, and metallic glasses. Journal of Applied Physics, 53 (6). 4180-4188 doi:10.1063/1.331241
Tsong, T. T., Kinkus, T. J. (1984) Energy distributions of pulsed-laser field-desorbed gaseous ions and field-evaporated metal ions: A direct time-of-flight measurement. Physical Review B, 29 (2) 529-542 doi:10.1103/physrevb.29.529
Tsong, T. T., Ng, Yee S., McLane, S. B. (1980) Surface segregation of a Pt–Au alloy: An atom‐probe field ion microscope investigation. The Journal of Chemical Physics, 73 (3) 1464-1468 doi:10.1063/1.440208
Tsong, T. T., Ng, Yee S., McLane, S. B. (1980) Surface segregation of Ni‐Cu alloy in nitrogen and oxygen: An atom‐probe field‐ion microscope study. Journal of Applied Physics, 51 (12). 6189-6191 doi:10.1063/1.327652
Kellogg, G. L., Tsong, T. T. (1980) Pulsed‐laser atom‐probe field‐ion microscopy. Journal of Applied Physics, 51 (2). 1184-1193 doi:10.1063/1.327686
Ahmad, M., Tsong, T. T. (1984) Surface segregation and diffusion kinetics study of a Pt‐Ir alloy using the time‐of‐flight atom‐probe field ion microscope. Applied Physics Letters, 44 (1). 40-42 doi:10.1063/1.94544
 
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