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Lazar, S, Etheridge, J, Dwyer, C, Freitag, B, Botton, GA (2010) Applications of spherical aberration correction in STEM and TEM. Microscopy and Microanalysis, 16. 68-69 doi:10.1017/s1431927610058034

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Reference TypeJournal (article/letter/editorial)
TitleApplications of spherical aberration correction in STEM and TEM
JournalMicroscopy and Microanalysis
AuthorsLazar, SAuthor
Etheridge, JAuthor
Dwyer, CAuthor
Freitag, BAuthor
Botton, GAAuthor
Year2010 (July)Volume16
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927610058034Search in ResearchGate
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Mindat Ref. ID4850897Long-form Identifiermindat:1:5:4850897:9
GUID0
Full ReferenceLazar, S, Etheridge, J, Dwyer, C, Freitag, B, Botton, GA (2010) Applications of spherical aberration correction in STEM and TEM. Microscopy and Microanalysis, 16. 68-69 doi:10.1017/s1431927610058034
Plain TextLazar, S, Etheridge, J, Dwyer, C, Freitag, B, Botton, GA (2010) Applications of spherical aberration correction in STEM and TEM. Microscopy and Microanalysis, 16. 68-69 doi:10.1017/s1431927610058034
In(2010) Microscopy and Microanalysis Vol. 16. Cambridge University Press (CUP)

See Also

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Lazar, S, Chang, L-Y, Gunawan, L, Shao, Y, Botton, GA (2009) Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials. Microscopy and Microanalysis, 15. 154-155 doi:10.1017/s1431927609098663
Chang, L-Y, Lazar, S, Baranova, EA, Bock, C, Botton, GA (2009) Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM. Microscopy and Microanalysis, 15. 1416-1417 doi:10.1017/s1431927609094744
Chang, L-Y, Lazar, S, Bártová, B, Botton, GA, Hébert, C, Morral, A Fontcuberta i (2009) Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration. Microscopy and Microanalysis, 15. 138-139 doi:10.1017/s1431927609096470
Maunders, C, Radtke, G, Robertson, M, Lazar, S, Whitfield, HJ, Etheridge, J, Botton, GA (2008) Investigation of the Hexagonal Perovskite Ba3Ti2RuO9 using High Resolution STEM and High Resolution EELS. Microscopy and Microanalysis, 14. 1342-1343 doi:10.1017/s1431927608087965
Botton, GA, Maunders, C, Shao, Y, Wu, M-Y, Lazar, S, Etheridge, J, Whitfield, HJ (2007) Electron Energy Loss Near-Edge Structures in Complex Perovskites. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607079329
Vajargah, SH, Couillard, M, Shao, Y, Tavakoli, S, Kleiman, R, Preston, J, Botton, GA (2010) Aberration-Corrected TEM Study of Defects in III-V Films Grown on Si. Microscopy and Microanalysis, 16. 1338-1339 doi:10.1017/s1431927610062033
Lazar, Sorin, Shao, Yang, Gunawan, Lina, Nechache, Riad, Pignolet, Alain, Botton, Gianluigi A. (2010) Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM. Microscopy and Microanalysis, 16 (4). 416-424 doi:10.1017/s1431927610013504
Zhu, Y, Katz-Boon, H, Zheng, CL, Walsh, M, Dwyer, C, Bourgeois, L, Withers, R, Etheridge, J (2015) Maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials. Microscopy and Microanalysis, 21. 2415-2416 doi:10.1017/s1431927615012854
Maunders, C, Whitfield, H, Radtke, G, Botton, G A, Lazar, S, Etheridge, J (2005) High Resolution EELS Investigation Of Hexagonal Transition Metal Perovskites. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509012
Rossouw, D, Mirkovic, T, Scholes, GD, Botton, GA (2010) TEM Analysis of EuS/CdSe Nano Heterostructures. Microscopy and Microanalysis, 16. 1292-1293 doi:10.1017/s1431927610062951
Haider, M., Hartel, P., Müller, H., Uhlemann, S., Zach, J. (2010) Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration. Microscopy and Microanalysis, 16 (4). 393-408 doi:10.1017/s1431927610013498
 
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