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Re, A, Lo Giudice, A, Angelici, D, Pratesi, G (2011) SEM-EDX and SEM-CL to Characterize Lapis Lazuli from Different Provenances. Microscopy and Microanalysis, 17. 1806-1807 doi:10.1017/s1431927611009901

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Reference TypeJournal (article/letter/editorial)
TitleSEM-EDX and SEM-CL to Characterize Lapis Lazuli from Different Provenances
JournalMicroscopy and Microanalysis
AuthorsRe, AAuthor
Lo Giudice, AAuthor
Angelici, DAuthor
Pratesi, GAuthor
Year2011 (July)Volume17
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927611009901Search in ResearchGate
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Mindat Ref. ID4857102Long-form Identifiermindat:1:5:4857102:7
GUID0
Full ReferenceRe, A, Lo Giudice, A, Angelici, D, Pratesi, G (2011) SEM-EDX and SEM-CL to Characterize Lapis Lazuli from Different Provenances. Microscopy and Microanalysis, 17. 1806-1807 doi:10.1017/s1431927611009901
Plain TextRe, A, Lo Giudice, A, Angelici, D, Pratesi, G (2011) SEM-EDX and SEM-CL to Characterize Lapis Lazuli from Different Provenances. Microscopy and Microanalysis, 17. 1806-1807 doi:10.1017/s1431927611009901
In(2011) Microscopy and Microanalysis Vol. 17. Cambridge University Press (CUP)

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Angelici, Debora, Borghi, Alessandro, Chiarelli, Fabrizia, Cossio, Roberto, Gariani, Gianluca, Lo Giudice, Alessandro, Re, Alessandro, Pratesi, Giovanni, Vaggelli, Gloria (2015) µ-XRF Analysis of Trace Elements in Lapis Lazuli-Forming Minerals for a Provenance Study. Microscopy and Microanalysis, 21 (2). 526-533 doi:10.1017/s143192761500015x
Re, A., Angelici, D., Lo Giudice, A., Maupas, E., Giuntini, L., Calusi, S., Gelli, N., Massi, M., Borghi, A., Gallo, L. M., Pratesi, G., Mandò, P. A. (2013) New markers to identify the provenance of lapis lazuli: trace elements in pyrite by means of micro-PIXE. Applied Physics A, 111. 69-74 doi:10.1007/s00339-013-7597-3
Re, Alessandro, Giudice, Alessandro Lo, Angelici, Debora, Calusi, Silvia, Giuntini, Lorenzo, Massi, Mirko, Pratesi, Giovanni (2011) Lapis lazuli provenance study by means of micro-PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 269 (20). 2373-2377 doi:10.1016/j.nimb.2011.02.070
Burdet, P, Hébert, C, Cantoni, M (2011) 3D EDX Microanalysis by FIB-SEM: Enhancement of Elemental Quantification. Microscopy and Microanalysis, 17. 960-961 doi:10.1017/s1431927611005678
Ritchie, N, Filip, V (2011) SEMantics for High Speed Automated Particle Analysis by SEM/EDX. Microscopy and Microanalysis, 17. 896-897 doi:10.1017/s1431927611005356
Shiono, Masamichi, Sakaue, Mari, Tomita, Shinichi (2018) Structural Analyses of a Spherulite Mineral Using SEM, CL, and EDX. Microscopy and Microanalysis, 24. 668-669 doi:10.1017/s1431927618003835
Geiss, R, Keller, R, Sitzman, S, Rice, P (2011) New Method of Transmission Electron Diffraction to Characterize Nanomaterials in the SEM. Microscopy and Microanalysis, 17. 386-387 doi:10.1017/s1431927611002807
Haswell, Ralph, Carlyle, Leslie, Mensch, Kees T.J. (2011) Quantitative Determination of van Gogh's Painting Grounds Using SEM/EDX. Microscopy and Microanalysis, 17 (5). 686-690 doi:10.1017/s1431927610094328
Newbury, D, Ritchie, N (2011) Is SEM/EDS Quantitative?. Microscopy and Microanalysis, 17. 558-559 doi:10.1017/s1431927611003667
Todd, C.S., Heeschen, W. (2013) Re-sampling of SEM-EDS Element Maps to Characterize the Length-Scale of Elemental Heterogeneity. Microscopy and Microanalysis, 19. 1282-1283 doi:10.1017/s1431927613008404
Jiruše, Jaroslav, Sytař, Petr, Páral, Jan, Hrnčíř, Tomáš (2020) An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column. Microscopy and Microanalysis, 26. 1806-1807 doi:10.1017/s1431927620019418
 
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