Reference Type | Journal (article/letter/editorial) |
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Title | In-situ SEM observation of ⟨110⟩ oriented Ge nanowire growth |
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Journal | Microscopy and Microanalysis |
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Authors | Vystavel, T. | Author |
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Novák, L. | Author |
Wandrol, P. | Author |
Kolíbal, M. | Author |
Mach, J. | Author |
Šikola, T. | Author |
Year | 2012 (July) | Volume | 18 |
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Publisher | Cambridge University Press (CUP) |
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DOI | doi:10.1017/s143192761200726xSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4859466 | Long-form Identifier | mindat:1:5:4859466:6 |
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GUID | 0 |
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Full Reference | Vystavel, T., Novák, L., Wandrol, P., Kolíbal, M., Mach, J., Šikola, T. (2012) In-situ SEM observation of ⟨110⟩ oriented Ge nanowire growth. Microscopy and Microanalysis, 18. 1082-1083 doi:10.1017/s143192761200726x |
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Plain Text | Vystavel, T., Novák, L., Wandrol, P., Kolíbal, M., Mach, J., Šikola, T. (2012) In-situ SEM observation of ⟨110⟩ oriented Ge nanowire growth. Microscopy and Microanalysis, 18. 1082-1083 doi:10.1017/s143192761200726x |
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In | (2012) Microscopy and Microanalysis Vol. 18. Cambridge University Press (CUP) |
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