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Diercks, D.R., Gorman, B.P. (2013) Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides. Microscopy and Microanalysis, 19. 962-963 doi:10.1017/s1431927613006806

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Reference TypeJournal (article/letter/editorial)
TitleAtom Probe Tomography of Grain Boundaries in Ion Conducting Oxides
JournalMicroscopy and Microanalysis
AuthorsDiercks, D.R.Author
Gorman, B.P.Author
Year2013 (August)Volume19
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927613006806Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4863445Long-form Identifiermindat:1:5:4863445:0
GUID0
Full ReferenceDiercks, D.R., Gorman, B.P. (2013) Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides. Microscopy and Microanalysis, 19. 962-963 doi:10.1017/s1431927613006806
Plain TextDiercks, D.R., Gorman, B.P. (2013) Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides. Microscopy and Microanalysis, 19. 962-963 doi:10.1017/s1431927613006806
In(2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP)

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Kirchhofer, R., Diercks, D.R., Gorman, B.P., Brennecka, G.L. (2013) Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy. Microscopy and Microanalysis, 19. 980-981 doi:10.1017/s1431927613006892
Gorman, B.P., Diercks, D.R., Kirchhofer, R. (2013) Laser and Material Effects on Laser Pulsed Atom Probe Analysis of Oxide and Nitride Ceramics. Microscopy and Microanalysis, 19. 1882-1883 doi:10.1017/s1431927613011409
Parman, S.W., Diercks, D.R., Gorman, B.P., Cooper, R.F. (2015) Atom probe tomography of isoferroplatinum. American Mineralogist: 100: 852-860.
Stokes, Adam, Al-Jassim, Mowafak, Gorman, Brian (2016) Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries. Microscopy and Microanalysis, 22. 644-645 doi:10.1017/s1431927616004074
Gorman, BP, Diercks, DR, Jaeger, D (2008) 3-D Cross-Correlation of Atom Probe and STEM Tomography. Microscopy and Microanalysis, 14. 1042-1043 doi:10.1017/s1431927608088417
Bachhav, M., Chen, Y., Marquis, E., Geiser, B. (2013) Measuring Chemical Segregation at Grain Boundaries by Atom Probe Tomography. Microscopy and Microanalysis, 19. 940-941 doi:10.1017/s1431927613006697
Diercks, David R., Gorman, Brian P., Gerstl, Stephan S.A. (2017) An Open-Access Atom Probe Tomography Mass Spectrum Database. Microscopy and Microanalysis, 23. 664-665 doi:10.1017/s1431927617003981
Diercks, D, Gorman, BP, Cheung, CL, Wang, G (2009) Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires. Microscopy and Microanalysis, 15. 254-255 doi:10.1017/s1431927609093398
Gorman, Brian P., Burton, George, Diercks, David R. (2017) Utilizing Atom Probe Tomography for 3-D Quantification of Point Defects. Microscopy and Microanalysis, 23. 1574-1575 doi:10.1017/s1431927617008534
Burton, George L., Diercks, David R., Gorman, Brian P. (2015) Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography. Microscopy and Microanalysis, 21. 693-694 doi:10.1017/s1431927615004262
Geiser, B.P., Larson, D.J., Prosa, T.J., Kelly, T.F. (2013) Progress in Planar Feature Spatial Reconstruction for Atom Probe Tomography. Microscopy and Microanalysis, 19. 936-937 doi:10.1017/s1431927613006673
 
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