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Kot, Miroslav (1993) Apparatus for minority‐carrier lifetime measurements on light‐emitting devices. Review of Scientific Instruments, 64 (5). 1268-1270 doi:10.1063/1.1144077

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Reference TypeJournal (article/letter/editorial)
TitleApparatus for minority‐carrier lifetime measurements on light‐emitting devices
JournalReview of Scientific Instruments
AuthorsKot, MiroslavAuthor
Year1993 (May)Volume64
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1144077Search in ResearchGate
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Mindat Ref. ID4865143Long-form Identifiermindat:1:5:4865143:9
GUID0
Full ReferenceKot, Miroslav (1993) Apparatus for minority‐carrier lifetime measurements on light‐emitting devices. Review of Scientific Instruments, 64 (5). 1268-1270 doi:10.1063/1.1144077
Plain TextKot, Miroslav (1993) Apparatus for minority‐carrier lifetime measurements on light‐emitting devices. Review of Scientific Instruments, 64 (5). 1268-1270 doi:10.1063/1.1144077
In(1993, May) Review of Scientific Instruments Vol. 64 (5) AIP Publishing

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Engler, A. R., Kevane, C. J. (1957) Direct Reading Minority Carrier Lifetime Measuring Apparatus. Review of Scientific Instruments, 28 (7). 548-551 doi:10.1063/1.1715929
Richardson, W. F., Meese, J. M., Westbrook, R. D. (1978) Photoconductivity null apparatus for the determination of minority carrier lifetime. Review of Scientific Instruments, 49 (3). 329-334 doi:10.1063/1.1135400
He, Yi, Hattori, Reiji, Kanicki, Jerzy (2000) Light output measurements of the organic light-emitting devices. Review of Scientific Instruments, 71 (5). 2104-2107 doi:10.1063/1.1150588
Araki, Tsutomu, Misawa, Hiroaki (1995) Light emitting diode‐based nanosecond ultraviolet light source for fluorescence lifetime measurements. Review of Scientific Instruments, 66 (12). 5469-5472 doi:10.1063/1.1146519
Gervais, J., Palais, O., Clerc, L., Martinuzzi, S. (1999) Minority carrier lifetime scan map in crystalline silicon wafers. Review of Scientific Instruments, 70 (10). 4044-4046 doi:10.1063/1.1150032
Ohsawa, Akira, Honda, Kouichirou, Takizawa, Ritsuo, Toyokura, Nobuo (1983) Instrument measuring temperature dependence of minority‐carrier lifetime without contact. Review of Scientific Instruments, 54 (2). 210-212 doi:10.1063/1.1137347
Berleb, S., Brütting, W., Schwoerer, M., Wehrmann, R., Elschner, A. (1998) Effect of majority carrier space charges on minority carrier injection in dye doped polymer light-emitting devices. Journal of Applied Physics, 83 (8). 4403-4409 doi:10.1063/1.367200
Calzona, V., Cimberle, M. R., Ferdeghini, C., Putti, M., Siri, A. S. (1993) Fully automated apparatus for thermal diffusivity measurements on HTSC in high magnetic field. Review of Scientific Instruments, 64 (3). 766-773 doi:10.1063/1.1144157
Byczkowski, M., Madigan, J. R. (1957) Minority Carrier Lifetime inp‐nJunction Devices. Journal of Applied Physics, 28 (8). 878-881 doi:10.1063/1.1722879
Sipior, Jeffrey, Carter, Gary M., Lakowicz, Joseph R., Rao, Govind (1996) Single quantum well light emitting diodes demonstrated as excitation sources for nanosecond phase‐modulation fluorescence lifetime measurements. Review of Scientific Instruments, 67 (11). 3795-3798 doi:10.1063/1.1147279
Sipior, Jeffrey, Carter, Gary M., Lakowicz, Joseph R., Rao, Govind (1997) Blue light-emitting diode demonstrated as an ultraviolet excitation source for nanosecond phase-modulation fluorescence lifetime measurements. Review of Scientific Instruments, 68 (7). 2666-2670 doi:10.1063/1.1148177
 
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