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Zolotoyabko, E., Panov, V., Schvarkov, D. (1993) Determination of ultrasound velocity and attenuation in single crystals by means of x‐ray diffraction. Review of Scientific Instruments, 64 (5). 1274-1279 doi:10.1063/1.1144079

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of ultrasound velocity and attenuation in single crystals by means of x‐ray diffraction
JournalReview of Scientific Instruments
AuthorsZolotoyabko, E.Author
Panov, V.Author
Schvarkov, D.Author
Year1993 (May)Volume64
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1144079Search in ResearchGate
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Mindat Ref. ID4865148Long-form Identifiermindat:1:5:4865148:4
GUID0
Full ReferenceZolotoyabko, E., Panov, V., Schvarkov, D. (1993) Determination of ultrasound velocity and attenuation in single crystals by means of x‐ray diffraction. Review of Scientific Instruments, 64 (5). 1274-1279 doi:10.1063/1.1144079
Plain TextZolotoyabko, E., Panov, V., Schvarkov, D. (1993) Determination of ultrasound velocity and attenuation in single crystals by means of x‐ray diffraction. Review of Scientific Instruments, 64 (5). 1274-1279 doi:10.1063/1.1144079
In(1993, May) Review of Scientific Instruments Vol. 64 (5) AIP Publishing

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Zolotoyabko, E., Polikarpov, I., Panov, V., Schvarkov, D. (1992) Determination of crystal imperfection by X-ray diffraction in a strong acoustic field. Journal of Applied Crystallography, 25 (2). 88-91 doi:10.1107/s0021889891010531
Zolotoyabko, E., Quintana, J. P. (2004) Control of synchrotron x-ray diffraction by means of standing acoustic waves. Review of Scientific Instruments, 75 (3). 699-708 doi:10.1063/1.1645652
(2009) Determination of three-dimensional orientations of ferroelectric single crystals by an improved rotating orientation x-ray diffraction method. Review of Scientific Instruments, 80 (8). 85106pp. doi:10.1063/1.3204781
Zolotoyabko, E., Sander, B., Komem, Y., Kantor, B. (1993) Improved strain analysis in semiconductor crystals by x‐ray diffractometry enhanced with ultrasound. Applied Physics Letters, 63 (11). 1540-1542 doi:10.1063/1.110742
Zolotoyabko, E., Jacobsohn, E., Shechtman, D., Kantor, B., Salzman, J. (1992) Acoustic field study in layered structures by means of x‐ray diffraction. Journal of Applied Physics, 71 (7). 3134-3137 doi:10.1063/1.350979
Zolotoyabko, E., Shilo, D., Sauer, W., Pernot, E., Baruchel, J. (1999) Stroboscopic x-ray topography in crystals under 10-μm-surface acoustic wave excitation. Review of Scientific Instruments, 70 (8). 3341-3345 doi:10.1063/1.1149916
Zolotoyabko, E., Quintana, J. P. (2002) Energy-tunable x-ray diffraction: A tool for depth profiling in polycrystalline materials. Review of Scientific Instruments, 73 (3). 1663-1667 doi:10.1063/1.1425388
Furnas, Thomas C., Harker, David (1955) Apparatus for Measuring Complete Single‐Crystal X‐Ray Diffraction Data by Means of a Geiger Counter Diffractometer. Review of Scientific Instruments, 26 (5). 449-453 doi:10.1063/1.1771322
Zolotoyabko, E. (2002) X-ray diffraction imaging of acoustic wave fronts in single crystals. Acta Crystallographica Section A Foundations of Crystallography, 58. doi:10.1107/s0108767302086877
Robinson, K. M., O’Grady, W. E. (1993) A transmission geometry electrochemical cell for in situ x‐ray diffraction. Review of Scientific Instruments, 64 (4). 1061-1065 doi:10.1063/1.1144178
Bainbridge, D. W. (1967) Elastic Strain Measurement in the Interior of Crystalline Materials by Means of X‐ray Diffraction. Review of Scientific Instruments, 38 (10). 1421-1424 doi:10.1063/1.1720554
 
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