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Orloff, Jon (1993) High‐resolution focused ion beams. Review of Scientific Instruments, 64 (5). 1105-1130 doi:10.1063/1.1144104

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Reference TypeJournal (article/letter/editorial)
TitleHigh‐resolution focused ion beams
JournalReview of Scientific Instruments
AuthorsOrloff, JonAuthor
Year1993 (May)Volume64
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1144104Search in ResearchGate
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Mindat Ref. ID4865216Long-form Identifiermindat:1:5:4865216:4
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Full ReferenceOrloff, Jon (1993) High‐resolution focused ion beams. Review of Scientific Instruments, 64 (5). 1105-1130 doi:10.1063/1.1144104
Plain TextOrloff, Jon (1993) High‐resolution focused ion beams. Review of Scientific Instruments, 64 (5). 1105-1130 doi:10.1063/1.1144104
In(1993, May) Review of Scientific Instruments Vol. 64 (5) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Orloff, Jon (1991) Focused Ion Beams. Scientific American, 265 (4) 96-101 doi:10.1038/scientificamerican1091-96
Wagner, Alfred (2004) High Resolution Focused Ion Beams: FIB and Its Applications High Resolution Focused Ion Beams: FIB and Its Applications , Jon Orloff , Mark Utlaut , and Lynwood Swanson Kluwer Academic/Plenum, New York, 2003. $145.00 (303 pp.). ISBN 0-306-47350-X. Physics Today, 57. 54-55 doi:10.1063/1.1650073
Orloff, Jon, Narayana, Chandrabhas, Ruoff, Arthur L. (2000) Use of focused ion beams for making tiny sample holes in gaskets for diamond anvil cells. Review of Scientific Instruments, 71 (1). 216-219 doi:10.1063/1.1150185
Orloff, Jon (2012) Gertrude Rempfer and the development of high resolution focused ion beam technology. Ultramicroscopy, 119. 5-8 doi:10.1016/j.ultramic.2011.10.002
Prewett, P. D. (1992) Focused ion beams in microfabrication (invited). Review of Scientific Instruments, 63 (4). 2364-2366 doi:10.1063/1.1142930
Adams, E. Dwight (1993) High‐resolution capacitive pressure gauges. Review of Scientific Instruments, 64 (3). 601-611 doi:10.1063/1.1144184
Höhr, C., Fischer, D., Moshammer, R., Dorn, A., Ullrich, J. (2008) A subnanosecond pulsed ion source for micrometer focused ion beams. Review of Scientific Instruments, 79 (5). 53102pp. doi:10.1063/1.2918136
Dietz, Leonard A. (1960) Transmission Optics of Focused Ion Beams Used in Mass Spectrometry. Review of Scientific Instruments, 31 (11). 1229-1233 doi:10.1063/1.1716859
Koizumi, H., Kuroda, K., Suzuki, T. (1993) Optical measurement of crack propagation with high resolution. Review of Scientific Instruments, 64 (7). 1822-1824 doi:10.1063/1.1144017
Chu, W. T., Ludewigt, B. A., Renner, T. R. (1993) Instrumentation for treatment of cancer using proton and light‐ion beams. Review of Scientific Instruments, 64 (8). 2055-2122 doi:10.1063/1.1143946
Mathew, Jose V., Bhattacharjee, Sudeep (2011) Compact electrostatic beam optics for multi-element focused ion beams: Simulation and experiments. Review of Scientific Instruments, 82 (1). 13501pp. doi:10.1063/1.3514989
 
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