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Baselt, David R., Clark, Steven M., Youngquist, Michael G., Spence, Charles F., Baldeschwieler, John D. (1993) Digital signal processor control of scanned probe microscopes. Review of Scientific Instruments, 64 (7). 1874-1882 doi:10.1063/1.1144462

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Reference TypeJournal (article/letter/editorial)
TitleDigital signal processor control of scanned probe microscopes
JournalReview of Scientific Instruments
AuthorsBaselt, David R.Author
Clark, Steven M.Author
Youngquist, Michael G.Author
Spence, Charles F.Author
Baldeschwieler, John D.Author
Year1993 (July)Volume64
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1144462Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4865685Long-form Identifiermindat:1:5:4865685:0
GUID0
Full ReferenceBaselt, David R., Clark, Steven M., Youngquist, Michael G., Spence, Charles F., Baldeschwieler, John D. (1993) Digital signal processor control of scanned probe microscopes. Review of Scientific Instruments, 64 (7). 1874-1882 doi:10.1063/1.1144462
Plain TextBaselt, David R., Clark, Steven M., Youngquist, Michael G., Spence, Charles F., Baldeschwieler, John D. (1993) Digital signal processor control of scanned probe microscopes. Review of Scientific Instruments, 64 (7). 1874-1882 doi:10.1063/1.1144462
In(1993, July) Review of Scientific Instruments Vol. 64 (7) AIP Publishing

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Clark, S. M., Baselt, D. R., Spence, C. F., Youngquist, M. G., Baldeschwieler, J. D. (1992) Hardware for digitally controlled scanned probe microscopes. Review of Scientific Instruments, 63 (10). 4296-4307 doi:10.1063/1.1143728
Baselt, David R., Baldeschwieler, John D. (1993) Scanned‐cantilever atomic force microscope. Review of Scientific Instruments, 64 (4). 908-911 doi:10.1063/1.1144142
Baselt, David R., Baldeschwieler, John D. (1994) Comment on ‘‘Scanned‐cantilever atomic force microscope’’ [Rev. Sci. Instrum. 64, 908 (1993)]. Review of Scientific Instruments, 65 (6). 2160 doi:10.1063/1.1144721
Clark, Steven M., Baldeschwieler, John D. (1993) A high performance scanning force microscope head design. Review of Scientific Instruments, 64 (4). 904-907 doi:10.1063/1.1144141
Hall, B. D., Klank, H., Eccles, C. D. (2000) A task-switching system for digital signal processor-based scanning probe microscopes. Review of Scientific Instruments, 71 (1). 318-319 doi:10.1063/1.1150200
Moon, John A. (1993) Optimization of signal‐to‐noise ratios in pump‐probe spectroscopy. Review of Scientific Instruments, 64 (7). 1775-1778 doi:10.1063/1.1144009
Baselt, David R., Baldeschwieler, John D. (1994) Imaging spectroscopy with the atomic force microscope. Journal of Applied Physics, 76 (1). 33-38 doi:10.1063/1.357150
Smith, W. F., Abraham, M. C., Sloan, J. M., Switkes, M. (1996) Simple retrofittable long‐range x–y translation system for scanned probe microscopes. Review of Scientific Instruments, 67 (10). 3599-3604 doi:10.1063/1.1147065
Lanni, Frederick (1993) Feedback‐stabilized focal plane control for light microscopes. Review of Scientific Instruments, 64 (6). 1474-1477 doi:10.1063/1.1144066
Tapson, J., Greene, J. R. (1993) A simple dynamic piezoelectric X‐Y translation stage suitable for scanning probe microscopes. Review of Scientific Instruments, 64 (8). 2387-2388 doi:10.1063/1.1143942
Musgrave, John A., Carey, Russell G., Janecky, David R., Tait, C. Drew (1994) Adaption of synchronously scanned luminescence spectroscopy to organic‐rich fluid inclusion microanalysis. Review of Scientific Instruments, 65 (6). 1877-1882 doi:10.1063/1.1144836
 
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