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Wood, J. W., Redin, R. D. (1993) A simple profilometer for film thickness measurement. Review of Scientific Instruments, 64 (8). 2405-2406 doi:10.1063/1.1143897

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Reference TypeJournal (article/letter/editorial)
TitleA simple profilometer for film thickness measurement
JournalReview of Scientific Instruments
AuthorsWood, J. W.Author
Redin, R. D.Author
Year1993 (August)Volume64
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.1143897Search in ResearchGate
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Mindat Ref. ID4865716Long-form Identifiermindat:1:5:4865716:9
GUID0
Full ReferenceWood, J. W., Redin, R. D. (1993) A simple profilometer for film thickness measurement. Review of Scientific Instruments, 64 (8). 2405-2406 doi:10.1063/1.1143897
Plain TextWood, J. W., Redin, R. D. (1993) A simple profilometer for film thickness measurement. Review of Scientific Instruments, 64 (8). 2405-2406 doi:10.1063/1.1143897
In(1993, August) Review of Scientific Instruments Vol. 64 (8) AIP Publishing

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Dumin, D. J. (1967) Measurement of Film Thickness Using Infrared Interference. Review of Scientific Instruments, 38 (8). 1107-1109 doi:10.1063/1.1720978
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Uyeda, Osamu (1967) Interferometer Jig for Film Thickness Measurement. Review of Scientific Instruments, 38 (2). 277-278 doi:10.1063/1.1771376
Dewhurst, R. J., Noui, L., Shan, Q. (1990) Polymer film thickness measurement using laser‐ultrasound techniques. Review of Scientific Instruments, 61 (6). 1736-1742 doi:10.1063/1.1141143
Roy, R. P., Ku, J., Kaufman, I., Shukla, J. (1986) Microwave method for measurement of liquid film thickness in gas– liquid flow. Review of Scientific Instruments, 57 (5). 952-956 doi:10.1063/1.1138841
Barter, J. D. (1993) A capacitive antenna for measurement of the dispersion relation of capillary waves on water. Review of Scientific Instruments, 64 (2). 556-560 doi:10.1063/1.1144232
Hadley, C. P. (1956) Measurement of Aluminum Film Thickness. Review of Scientific Instruments, 27 (3). 176 doi:10.1063/1.1715517
 
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