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Umemura, Kaoru, Shichi, Hiroyasu, Nomura, Setsuo (1994) Cesium liquid metal ion source for secondary ion mass spectrometry. Review of Scientific Instruments, 65 (7). 2276-2280 doi:10.1063/1.1144676

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Reference TypeJournal (article/letter/editorial)
TitleCesium liquid metal ion source for secondary ion mass spectrometry
JournalReview of Scientific Instruments
AuthorsUmemura, KaoruAuthor
Shichi, HiroyasuAuthor
Nomura, SetsuoAuthor
Year1994 (July)Volume65
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1144676Search in ResearchGate
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Mindat Ref. ID4868045Long-form Identifiermindat:1:5:4868045:9
GUID0
Full ReferenceUmemura, Kaoru, Shichi, Hiroyasu, Nomura, Setsuo (1994) Cesium liquid metal ion source for secondary ion mass spectrometry. Review of Scientific Instruments, 65 (7). 2276-2280 doi:10.1063/1.1144676
Plain TextUmemura, Kaoru, Shichi, Hiroyasu, Nomura, Setsuo (1994) Cesium liquid metal ion source for secondary ion mass spectrometry. Review of Scientific Instruments, 65 (7). 2276-2280 doi:10.1063/1.1144676
In(1994, July) Review of Scientific Instruments Vol. 65 (7) AIP Publishing

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Yurimoto, Hisayoshi, Mori, Yoshiharu, Yamamoto, Hironori (1993) Negative metal‐ion source for secondary‐ion mass spectrometry. Review of Scientific Instruments, 64 (5). 1146-1149 doi:10.1063/1.1144108
Shichi, Hiroyasu, Ohnishi, Kazuhiro, Nomura, Setsuo (1991) Secondary Ion Yield Changes in Si due to Topography Changes during Cs+Ion Bombardment. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l927
Tang, J. T. (1994) Gallium liquid metal ion source (abstract). Review of Scientific Instruments, 65 (4). 1355 doi:10.1063/1.1144958
Ptitsin, V. E. (1994) Model of the mechanism of liquid metal ion source emission. Review of Scientific Instruments, 65 (4). 1354 doi:10.1063/1.1144957
Nomura, Setsuo, Shichi, Hiroyasu (1991) High Contrast of Scanning Ion Microscopy Images Shows Element Segregation. Japanese Journal of Applied Physics, 30. doi:10.1143/jjap.30.l1059
Coath, C. D., Long, J. V. P. (1995) A high‐brightness duoplasmatron ion source for microprobe secondary‐ion mass spectrometry. Review of Scientific Instruments, 66 (2). 1018-1023 doi:10.1063/1.1146038
Zinkiewicz, J. M., Sowa, M., Baranowski, R., Glusiec, L., Kiszczak, K. (1992) A new thermal emission cesium primary ion source for secondary ion mass spectrometer. Review of Scientific Instruments, 63 (4). 2414-2416 doi:10.1063/1.1142947
Shichi, Hiroyasu, Izumi, Eiichi, Mitani, Eisuke, Tamura, Hifumi (1986) Development and application of a new type cesium surface ionization ion source for SIMS. Journal of the Mass Spectrometry Society of Japan, 34 (1). 13-20 doi:10.5702/massspec.34.13
Ishitani, Tohru, Umemura, Kaoru, Kawanami, Yoshimi (1994) Liquid Metal Ion Sources: Normalization of Virtual Source Size and Angular Ion Intensity. Japanese Journal of Applied Physics, 33. doi:10.1143/jjap.33.l479
Anderson, J. F., Berry, S. D. (1994) Elliptical reflector low‐pass energy filter for a liquid metal ion source cluster deposition system. Review of Scientific Instruments, 65 (6). 2023-2027 doi:10.1063/1.1144807
Gnaser, H., Rüdenauer, F.G. (1983) Evaluation of a liquid metal ion source for secondary ion mass spectrometry. Nuclear Instruments and Methods in Physics Research, 218 (1). 303-306 doi:10.1016/0167-5087(83)90995-x
 
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