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Dahmen, Tim, Baudoin, Jean-Pierre, Lupini, Andrew R., Kübel, Christian, Slusallek, Philipp, de Jonge, Niels (2014) Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. Microscopy and Microanalysis, 20 (2). 548-560 doi:10.1017/s1431927614000075

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Reference TypeJournal (article/letter/editorial)
TitleCombined Scanning Transmission Electron Microscopy Tilt- and Focal Series
JournalMicroscopy and Microanalysis
AuthorsDahmen, TimAuthor
Baudoin, Jean-PierreAuthor
Lupini, Andrew R.Author
Kübel, ChristianAuthor
Slusallek, PhilippAuthor
de Jonge, NielsAuthor
Year2014 (April)Volume20
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927614000075Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4869957Long-form Identifiermindat:1:5:4869957:2
GUID0
Full ReferenceDahmen, Tim, Baudoin, Jean-Pierre, Lupini, Andrew R., Kübel, Christian, Slusallek, Philipp, de Jonge, Niels (2014) Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. Microscopy and Microanalysis, 20 (2). 548-560 doi:10.1017/s1431927614000075
Plain TextDahmen, Tim, Baudoin, Jean-Pierre, Lupini, Andrew R., Kübel, Christian, Slusallek, Philipp, de Jonge, Niels (2014) Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. Microscopy and Microanalysis, 20 (2). 548-560 doi:10.1017/s1431927614000075
In(2014, April) Microscopy and Microanalysis Vol. 20 (2) Cambridge University Press (CUP)

See Also

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Dahmen, Tim, Baudoin, Jean-Pierre, Lupini, Andrew R., Kübel, Christian, Slusallek, Philipp, de Jonge, Niels (2014) TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 20. 786-787 doi:10.1017/s1431927614005650
Dahmen, Tim, Kohr, Holger, Lupini, Andrew R., Baudoin, Jean-Pierre, Kübel, Christian, Trampert, Patrick, Slusallek, Philipp, de Jonge, Niels (2016) Combined Tilt- and Focal-Series Tomography for HAADF-STEM. Microscopy Today, 24 (3). 26-31 doi:10.1017/s1551929516000328
Dahmen, Tim, Kohr, Holger, de Jonge, Niels, Slusallek, Philipp (2015) Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 21. 2337-2338 doi:10.1017/s1431927615012465
Dahmen, Tim, Kohr, Holger, de Jonge, Niels, Slusallek, Philipp (2015) Matched Backprojection Operator for Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series. Microscopy and Microanalysis, 21 (3). 725-738 doi:10.1017/s1431927615000525
Dahmen, Tim, de Jonge, Niels, Trampert, Patrick, Engstler, Michael, Pauly, Christoph, Mücklich, Frank, Slusallek, Philipp (2016) “Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy. Microscopy and Microanalysis, 22. 632-633 doi:10.1017/s1431927616004013
Lupini, Andrew R., de Jonge, Niels (2011) The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 17 (5). 817-826 doi:10.1017/s1431927611011913
Baudoin, Jean-Pierre, Jinschek, Joerg R., Boothroyd, Chris B., Dunin-Borkowski, Rafal E., de Jonge, Niels (2013) Chromatic Aberration-Corrected Tilt Series Transmission Electron Microscopy of Nanoparticles in a Whole Mount Macrophage Cell. Microscopy and Microanalysis, 19 (4). 814-820 doi:10.1017/s1431927613001475
Dahmen, Tim, Engstler, Michael, Pauly, Christoph, Trampert, Patrick, de Jonge, Niels, Mücklich, Frank, Slusallek, Philipp (2016) Feature Adaptive Sampling for Scanning Electron Microscopy. Scientific Reports, 6. doi:10.1038/srep25350
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2019) Deep Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 25. 158-159 doi:10.1017/s1431927619001521
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2018) Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 24. 700-701 doi:10.1017/s1431927618003999
Peckys, Diana B., de Jonge, Niels (2014) Liquid Scanning Transmission Electron Microscopy: Imaging Protein Complexes in their Native Environment in Whole Eukaryotic Cells. Microscopy and Microanalysis, 20 (2). 346-365 doi:10.1017/s1431927614000099
 
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