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Bresin, Matthew, Botman, Aurelien, Randolph, Steven J, Straw, Marcus, Hastings, Jeffrey Todd (2014) Liquid Phase Electron-Beam-Induced Deposition on Bulk Substrates Using Environmental Scanning Electron Microscopy. Microscopy and Microanalysis, 20 (2). 376-384 doi:10.1017/s1431927614000117

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Reference TypeJournal (article/letter/editorial)
TitleLiquid Phase Electron-Beam-Induced Deposition on Bulk Substrates Using Environmental Scanning Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsBresin, MatthewAuthor
Botman, AurelienAuthor
Randolph, Steven JAuthor
Straw, MarcusAuthor
Hastings, Jeffrey ToddAuthor
Year2014 (April)Volume20
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927614000117Search in ResearchGate
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Mindat Ref. ID4869968Long-form Identifiermindat:1:5:4869968:8
GUID0
Full ReferenceBresin, Matthew, Botman, Aurelien, Randolph, Steven J, Straw, Marcus, Hastings, Jeffrey Todd (2014) Liquid Phase Electron-Beam-Induced Deposition on Bulk Substrates Using Environmental Scanning Electron Microscopy. Microscopy and Microanalysis, 20 (2). 376-384 doi:10.1017/s1431927614000117
Plain TextBresin, Matthew, Botman, Aurelien, Randolph, Steven J, Straw, Marcus, Hastings, Jeffrey Todd (2014) Liquid Phase Electron-Beam-Induced Deposition on Bulk Substrates Using Environmental Scanning Electron Microscopy. Microscopy and Microanalysis, 20 (2). 376-384 doi:10.1017/s1431927614000117
In(2014, April) Microscopy and Microanalysis Vol. 20 (2) Cambridge University Press (CUP)

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Randolph, Steven J., Botman, Aurelien, Toth, Milos (2013) Capsule-free fluid delivery and beam-induced electrodeposition in a scanning electron microscope. RSC Advances, 3 (43). 20016pp. doi:10.1039/c3ra42840k
Echlin, McLean, Polonsky, Andrew, Francis, Toby, Lenthe, Will, Titus, Mike, Mottura, Alessandro, Torbet, Chris, Randolph, Steven, Botman, Aurelien, Filevich, Jorge, Geurts, Remco, Straw, Marcus, Pollock, Tresa (2020) TriBeam Tomography for 3D Data Acquisition. Microscopy and Microanalysis, 26. 2624-2625 doi:10.1017/s1431927620022229
Bresin, Matthew, Chamberlain, Adam, Donev, Eugenii U., Samantaray, Chandan B., Schardien, Gregory S., Hastings, J. Todd (2013) Electron-Beam-Induced Deposition of Bimetallic Nanostructures from Bulk Liquids. Angewandte Chemie, 125 (31). 8162-8165 doi:10.1002/ange.201303740
Bresin, Matthew, Chamberlain, Adam, Donev, Eugenii U., Samantaray, Chandan B., Schardien, Gregory S., Hastings, J. Todd (2013) Electron-Beam-Induced Deposition of Bimetallic Nanostructures from Bulk Liquids. Angewandte Chemie International Edition, 52 (31). 8004-8007 doi:10.1002/anie.201303740
Xie, G, Song, M, Mitsuishi, K, Furuya, K (2005) Transmission Electron Microscopy of Metal Nanodendrites Grown on Insulator Substrates by Electron-Beam-Induced Deposition. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605505075
Donev, E, Nehru, N, Schardein, G, Wright, J, Chamberlain, A, Samantaray, C, Hastings, J (2011) Recent Advances in Liquid-phase Electron-Beam Induced Deposition: Characterizing Growth Processes and Optical Properties. Microscopy and Microanalysis, 17. 438-439 doi:10.1017/s1431927611003060
Liu, Yin, Dillon, Shen (2014) Environmental Electron Microscopy: Electron Beam Effects in Electrochemistry. Microscopy and Microanalysis, 20. 1616-1617 doi:10.1017/s1431927614009817
Peckys, Diana B., de Jonge, Niels (2014) Gold Nanoparticle Uptake in Whole Cells in Liquid Examined by Environmental Scanning Electron Microscopy. Microscopy and Microanalysis, 20 (1). 189-197 doi:10.1017/s1431927613013986
Li, J, Bresin, M, Dunn, KA, Thiel, BL (2007) Determination of Impurity Carbon sp2/sp3 Bond Ratio in Electron Beam Deposited Tungsten Nanostructures using Electron Energy Loss Spectroscopy. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607078270
Liu, Yuzi, Sun, Yugang (2014) Environmental TEM Study of Electron Beam Induced Sintering of Ag Nanoparticles. Microscopy and Microanalysis, 20. 1636-1637 doi:10.1017/s143192761400991x
Liu, Z.Q., Mitsuishi, K., Furuya, K. (2004) Nanofabrication of Tungsten Structure by Electron-Beam-Induced Deposition in Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 10. 566-567 doi:10.1017/s1431927604883831
 
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