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Wirtz, T., Dowsett, D., Eswara Moorthy, S. (2015) Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics. Microscopy and Microanalysis, 21. 13-14 doi:10.1017/s1431927615000860

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Reference TypeJournal (article/letter/editorial)
TitleCorrelative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics
JournalMicroscopy and Microanalysis
AuthorsWirtz, T.Author
Dowsett, D.Author
Eswara Moorthy, S.Author
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615000860Search in ResearchGate
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Mindat Ref. ID4870837Long-form Identifiermindat:1:5:4870837:5
GUID0
Full ReferenceWirtz, T., Dowsett, D., Eswara Moorthy, S. (2015) Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics. Microscopy and Microanalysis, 21. 13-14 doi:10.1017/s1431927615000860
Plain TextWirtz, T., Dowsett, D., Eswara Moorthy, S. (2015) Correlative Microscopy based on Secondary Ion Mass Spectrometry for High-Resolution High-Sensitivity Nano-Analytics. Microscopy and Microanalysis, 21. 13-14 doi:10.1017/s1431927615000860
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

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Wirtz, T., Dowsett, D., Eswara Moorthy, S., Fleming, Y. (2014) SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics. Microscopy and Microanalysis, 20. 966-967 doi:10.1017/s1431927614006552
Wirtz, T., Dowsett, D., Philipp, P., Audinot, J.-N., Eswara Moorthy, S. (2015) SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics. Microscopy and Microanalysis, 21. 2319-2320 doi:10.1017/s1431927615012374
Eswara Moorthy, S., Dowsett, D., Yedra, L., Wirtz, T. (2015) Parallel Ion Electron Spectrometry (PIES): A New Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS. Microscopy and Microanalysis, 21. 1859-1860 doi:10.1017/s1431927615010077
Yedra, L., Eswara, S., Dowsett, D., Hoang, H. Q., Wirtz, T. (2017) Secondary Ion Mass Spectrometry in the TEM: Isotope Specific High Resolution Correlative Imaging. Microscopy and Microanalysis, 23. 316-317 doi:10.1017/s1431927617002264
Eswara Moorthy, Santhana, Dowsett, David, Wirtz, Tom (2014) Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology. Microscopy and Microanalysis, 20. 970-971 doi:10.1017/s1431927614006576
Wirtz, Tom, Dowsett, David, Audinot, Jean-Nicolas, Eswara, Santhana (2016) SIMS on the Helium Ion Microscope: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics. Microscopy and Microanalysis, 22. 160-161 doi:10.1017/s1431927616001653
Lovric, Jelena, Audinot, Jean-Nicolas, Wirtz, Tom (2019) In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for High-Resolution Nano-Analytics in Life Sciences. Microscopy and Microanalysis, 25. 1026-1027 doi:10.1017/s1431927619005865
Fleming, Y., Wirtz, T., Eswara Moorthy, S. (2015) Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis. Microscopy and Microanalysis, 21. 1437-1438 doi:10.1017/s1431927615007965
Biesemeier, Antje, Castro, Olivier De, Serralta, Eduardo, Lovric, Jelena, Eswara, Santhana, Audinot, Jean-Nicolas, Cambier, Sébastien, Wirtz, Tom (2020) Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue. Microscopy and Microanalysis, 26. 818-820 doi:10.1017/s1431927620015950
Wirtz, T., Dowsett, D., Vanhove, N., Fleming, Y. (2013) Correlative Microscopy Using SIMS For High-Sensitivity Elemental Mapping. Microscopy and Microanalysis, 19. 356-357 doi:10.1017/s1431927613003772
Wirtz, T., Pillatsch, L., Vanhove, N., Dowsett, D., Sijbrandij, S., Notte, J. (2012) Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope. Microscopy and Microanalysis, 18. 812-813 doi:10.1017/s1431927612005910
 
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