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Vilalta-Clemente, Arantxa, Jiang, Jun, Britton, Ben, Collins, David M, Wilkinson, Angus (2015) Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 1891-1892 doi:10.1017/s1431927615010235

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction
JournalMicroscopy and Microanalysis
AuthorsVilalta-Clemente, ArantxaAuthor
Jiang, JunAuthor
Britton, BenAuthor
Collins, David MAuthor
Wilkinson, AngusAuthor
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615010235Search in ResearchGate
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Mindat Ref. ID4873863Long-form Identifiermindat:1:5:4873863:1
GUID0
Full ReferenceVilalta-Clemente, Arantxa, Jiang, Jun, Britton, Ben, Collins, David M, Wilkinson, Angus (2015) Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 1891-1892 doi:10.1017/s1431927615010235
Plain TextVilalta-Clemente, Arantxa, Jiang, Jun, Britton, Ben, Collins, David M, Wilkinson, Angus (2015) Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 1891-1892 doi:10.1017/s1431927615010235
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

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Tong, Vivian, Jiang, Jun, Wilkinson, Angus, Britton, Ben (2015) Pattern Overlap and High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 2045-2046 doi:10.1017/s1431927615011009
Vilalta-Clemente, Arantxa, Naresh-Kumar, G., Nouf-Allehiani, M., Parbrook, Peter J., Boulbar, Emmanuel D.Le, Allsopp, Duncan, Shields, Philip A., Trager-Cowan, Carol, Wilkinson, Angus J. (2015) High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors. Microscopy and Microanalysis, 21. 2217-2218 doi:10.1017/s1431927615011861
Wilkinson, Angus J, Collins, David M, Zayachuk, Yevhen, Korla, Rajesh, Vilalta-Clemente, Arantxa (2019) Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets. Ultramicroscopy, 196. 88-98 doi:10.1016/j.ultramic.2018.09.011
Wallis, David, Hansen, Lars N., Ben Britton, T., Wilkinson, Angus J. (2016) Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction. Ultramicroscopy, 168. 34-45 doi:10.1016/j.ultramic.2016.06.002
Vilalta-Clemente, Arantxa, Meisnar, Martina, Lozano-Perez, Sergio, Wilkinson, Angus J. (2015) Characterization of Elastic Strain Field and Geometrically Necessary Dislocation Distribution in Stress Corrosion Cracking of 316 Stainless Steels by Transmission Kikuchi Diffraction. Microscopy and Microanalysis, 21. 605-606 doi:10.1017/s1431927615003827
Wilkinson, Angus J., Tarleton, Edmund, Vilalta-Clemente, Arantxa, Jiang, Jun, Britton, T. Benjamin, Collins, David M. (2014) Measurement of probability distributions for internal stresses in dislocated crystals. Applied Physics Letters, 105 (18). 181907pp. doi:10.1063/1.4901219
Foden, Alexander, Collins, David M., Wilkinson, Angus J., Britton, T. Benjamin (2019) Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach. Microscopy and Microanalysis, 25. 1962-1963 doi:10.1017/s1431927619010547
Tong, Vivian, Jiang, Jun, Wilkinson, Angus J., Britton, T. Ben (2015) The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy, 155. 62-73 doi:10.1016/j.ultramic.2015.04.019
Wilkinson, Angus J, Zayachuk, Yevhen, Collins, David M, Korla, Rajesh (2017) Applications of Multivariate Statistical Methods to Analysis of Electron Backscatter Diffraction and Transmission Kikuchi Diffraction Datasets. Microscopy and Microanalysis, 23. 544-545 doi:10.1017/s1431927617003403
Tanaka, Tomohito, Wilkinson, Angus J (2018) High Angular Resolution Electron Backscatter Diffraction Studies of Tetragonality in Fe-C Martensitic Steels. Microscopy and Microanalysis, 24. 962-963 doi:10.1017/s1431927618005305
Seal, J.R., Bieler, T., Crimp, M., Britton, B., Wilkinson, A. (2012) Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI). Microscopy and Microanalysis, 18. 702-703 doi:10.1017/s1431927612005363
 
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