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Vitale, Suzy, Sugar, Joshua D., Cappillino, Patrick J., Giannuzzi, Lucille A., Robinson, David B. (2016) Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam. Microscopy and Microanalysis, 22. 180-181 doi:10.1017/s1431927616001756

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Reference TypeJournal (article/letter/editorial)
TitleSite Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam
JournalMicroscopy and Microanalysis
AuthorsVitale, SuzyAuthor
Sugar, Joshua D.Author
Cappillino, Patrick J.Author
Giannuzzi, Lucille A.Author
Robinson, David B.Author
Year2016 (July)Volume22
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927616001756Search in ResearchGate
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Mindat Ref. ID4876216Long-form Identifiermindat:1:5:4876216:0
GUID0
Full ReferenceVitale, Suzy, Sugar, Joshua D., Cappillino, Patrick J., Giannuzzi, Lucille A., Robinson, David B. (2016) Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam. Microscopy and Microanalysis, 22. 180-181 doi:10.1017/s1431927616001756
Plain TextVitale, Suzy, Sugar, Joshua D., Cappillino, Patrick J., Giannuzzi, Lucille A., Robinson, David B. (2016) Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam. Microscopy and Microanalysis, 22. 180-181 doi:10.1017/s1431927616001756
In(2016) Microscopy and Microanalysis Vol. 22. Cambridge University Press (CUP)

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Vitale, Suzy, Sugar, Joshua (2021) Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy. Microscopy and Microanalysis, 27. 218-219 doi:10.1017/s1431927621001379
Vitale, Suzy M, Sugar, Joshua D (2023) Lessons Learned from Failed TEM Sample Preparation Attempts Using a Focused Ion Beam. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 428-429 doi:10.1093/micmic/ozad067.202
Lomness, Janice K., Giannuzzi, Lucille A., Hampton, Michael D. (2001) Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique. Microscopy and Microanalysis, 7 (5). 418-423 doi:10.1017/s1431927601010418
Sugar, Joshua D., Homer, Mark, Kotula, Paul G., Cappillino, Patrick J., Ong, Markus, Robinson, David B. (2015) Quantitative EDS of Surface Modified Pd Powders for Hydrogen Storage. Microscopy and Microanalysis, 21. 1083-1084 doi:10.1017/s1431927615006200
Vitale, Suzy M., Sugar, Joshua D. (2022) Using Xe Plasma FIB for High-Quality TEM Sample Preparation. Microscopy and Microanalysis, 28 (3) 646-658 doi:10.1017/s1431927622000344
Homer, Mark, Cappillino, Patrick, El Gabaly, Farid, Gnaegi, Helmut, Robinson, Dave, Sugar, Josh (2015) Preparation of Electron and X-Ray Transparent Inorganic Particles for Analytical Microscopy Using the Ultramicrotome. Microscopy and Microanalysis, 21. 1815-1816 doi:10.1017/s143192761500985x
Vitale, Suzy M, Sugar, Joshua D, Rogers, Meghan J, Hui, Carly S, Robinson, David B (2024) TEM Sample Preparation and TKD Analysis of Epoxy-Embedded Pd Powder Particles Using a DualBeam FIB/SEM. Microscopy and Microanalysis, 30. doi:10.1093/mam/ozae044.983
Anzalone, Paul A., Giannuzzi, Lucille A. (2016) Site-Specific Manipulation of CNTs to EXpressLOâ„¢ Grids for TEM Analysis. Microscopy and Microanalysis, 22. 1744-1745 doi:10.1017/s1431927616009569
Leer, B Van, Giannuzzi, LA (2008) Advances in TEM Sample Preparation Using a Focused Ion Beam. Microscopy and Microanalysis, 14. 380-381 doi:10.1017/s1431927608086030
Vitale, Suzy, Steele, Andrew, Benning, Liane G., Wirth, Richard (2019) Semi-Inverted Sample Preparation of Meteorites for High Resolution Analytical Electron Microscopy Using Correlative Raman Spectroscopy and Xe Plasma FIB. Microscopy and Microanalysis, 25. 894-895 doi:10.1017/s1431927619005208
Prosa, Ty J., Larson, David J. (2017) Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 194-209 doi:10.1017/s1431927616012642
 
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