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Snyder, Chad R., Mopsik, Frederick I. (1998) A precision capacitance cell for measurement of thin film out-of-plane expansion. I. Thermal expansion. Review of Scientific Instruments, 69 (11). 3889-3895 doi:10.1063/1.1149195

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Reference TypeJournal (article/letter/editorial)
TitleA precision capacitance cell for measurement of thin film out-of-plane expansion. I. Thermal expansion
JournalReview of Scientific Instruments
AuthorsSnyder, Chad R.Author
Mopsik, Frederick I.Author
Year1998 (November)Volume69
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.1149195Search in ResearchGate
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Mindat Ref. ID4879009Long-form Identifiermindat:1:5:4879009:3
GUID0
Full ReferenceSnyder, Chad R., Mopsik, Frederick I. (1998) A precision capacitance cell for measurement of thin film out-of-plane expansion. I. Thermal expansion. Review of Scientific Instruments, 69 (11). 3889-3895 doi:10.1063/1.1149195
Plain TextSnyder, Chad R., Mopsik, Frederick I. (1998) A precision capacitance cell for measurement of thin film out-of-plane expansion. I. Thermal expansion. Review of Scientific Instruments, 69 (11). 3889-3895 doi:10.1063/1.1149195
In(1998, November) Review of Scientific Instruments Vol. 69 (11) AIP Publishing

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Snyder, Chad R., Mopsik, Frederick I. (1999) A precision capacitance cell for measurement of thin film out-of-plane expansion. II. Hygrothermal expansion. Review of Scientific Instruments, 70 (5). 2424-2431 doi:10.1063/1.1149791
Snyder, Chad R., Mopsik, Frederick I. (1998) Limitations on distinguishing between representations of relaxation data over narrow frequency ranges. Journal of Applied Physics, 84 (8). 4421-4427 doi:10.1063/1.368665
Mopsik, Frederick I. (2000) Extended frequency range dielectric measurements of thin films. Review of Scientific Instruments, 71 (6). 2456-2460 doi:10.1063/1.1150663
Rotter, M., MĆ¼ller, H., Gratz, E., Doerr, M., Loewenhaupt, M. (1998) A miniature capacitance dilatometer for thermal expansion and magnetostriction. Review of Scientific Instruments, 69 (7). 2742-2746 doi:10.1063/1.1149009
Snyder, Chad R., Mopsik, Frederick I. (1999) Critical comparison between time- and frequency-domain relaxation functions. Physical Review B, 60 (2) 984-990 doi:10.1103/physrevb.60.984
Snyder, Chad R., Mopsik, Frederick I. (1999) Dynamically induced loss and its implications on temperature scans of relaxation processes. The Journal of Chemical Physics, 110 (2). 1106-1111 doi:10.1063/1.478154
Mopsik, F. I. (1984) Precision timeā€domain dielectric spectrometer. Review of Scientific Instruments, 55 (1). 79-87 doi:10.1063/1.1137594
Snyder, James J. (1993) Accurate, inexpensive, thermal expansion microtranslator. Review of Scientific Instruments, 64 (5). 1351-1354 doi:10.1063/1.1144092
Hahm, Chris D., Bhushan, Bharat (1998) Lubricant film thickness mapping using a capacitance technique on magnetic thin-film rigid disks. Review of Scientific Instruments, 69 (9). 3339-3349 doi:10.1063/1.1149098
Villar, R., Hortal, M., Vieira, S. (1980) Silicon cell for the precise measurement of thermal expansion at low temperatures: Results for Cu and NaF. Review of Scientific Instruments, 51 (1). 27-31 doi:10.1063/1.1136050
Langelaan, G., Saimoto, S. (1999) Thermal expansion measurement of pure aluminum using a very low thermal expansion heating stage for x-ray diffraction experiments. Review of Scientific Instruments, 70 (8). 3413-3417 doi:10.1063/1.1149928
 
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