Wu, Yueying, Liu, Chenze, Moore, Thomas M., Magel, Gregory A., Garfinkel, David A., Camden, Jon P., Stanford, Michael G., Duscher, Gerd, Rack, Philip D. (2018) Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films. Microscopy and Microanalysis, 24 (6). 647-656 doi:10.1017/s1431927618015465
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Wu, Yueying | Author | |
| Liu, Chenze | Author | ||
| Moore, Thomas M. | Author | ||
| Magel, Gregory A. | Author | ||
| Garfinkel, David A. | Author | ||
| Camden, Jon P. | Author | ||
| Stanford, Michael G. | Author | ||
| Duscher, Gerd | Author | ||
| Rack, Philip D. | Author | ||
| Year | 2018 (December) | Volume | 24 |
| Issue | 6 | ||
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927618015465Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4885514 | Long-form Identifier | mindat:1:5:4885514:1 |
| GUID | 0 | ||
| Full Reference | Wu, Yueying, Liu, Chenze, Moore, Thomas M., Magel, Gregory A., Garfinkel, David A., Camden, Jon P., Stanford, Michael G., Duscher, Gerd, Rack, Philip D. (2018) Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films. Microscopy and Microanalysis, 24 (6). 647-656 doi:10.1017/s1431927618015465 | ||
| Plain Text | Wu, Yueying, Liu, Chenze, Moore, Thomas M., Magel, Gregory A., Garfinkel, David A., Camden, Jon P., Stanford, Michael G., Duscher, Gerd, Rack, Philip D. (2018) Exploring Photothermal Pathways via in Situ Laser Heating in the Transmission Electron Microscope: Recrystallization, Grain Growth, Phase Separation, and Dewetting in Ag0.5Ni0.5 Thin Films. Microscopy and Microanalysis, 24 (6). 647-656 doi:10.1017/s1431927618015465 | ||
| In | (2018, December) Microscopy and Microanalysis Vol. 24 (6) Cambridge University Press (CUP) | ||
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