Takeuchi, Akihisa, Uesugi, Kentaro, Takano, Hidekazu, Suzuki, Yoshio (2002) Submicrometer-resolution three-dimensional imaging with hard x-ray imaging microtomography. Review of Scientific Instruments, 73 (12). 4246-4249 doi:10.1063/1.1515385
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Submicrometer-resolution three-dimensional imaging with hard x-ray imaging microtomography | ||
Journal | Review of Scientific Instruments | ||
Authors | Takeuchi, Akihisa | Author | |
Uesugi, Kentaro | Author | ||
Takano, Hidekazu | Author | ||
Suzuki, Yoshio | Author | ||
Year | 2002 (December) | Volume | 73 |
Issue | 12 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1515385Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4886468 | Long-form Identifier | mindat:1:5:4886468:0 |
GUID | 0 | ||
Full Reference | Takeuchi, Akihisa, Uesugi, Kentaro, Takano, Hidekazu, Suzuki, Yoshio (2002) Submicrometer-resolution three-dimensional imaging with hard x-ray imaging microtomography. Review of Scientific Instruments, 73 (12). 4246-4249 doi:10.1063/1.1515385 | ||
Plain Text | Takeuchi, Akihisa, Uesugi, Kentaro, Takano, Hidekazu, Suzuki, Yoshio (2002) Submicrometer-resolution three-dimensional imaging with hard x-ray imaging microtomography. Review of Scientific Instruments, 73 (12). 4246-4249 doi:10.1063/1.1515385 | ||
In | (2002, December) Review of Scientific Instruments Vol. 73 (12) AIP Publishing |
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