Johari, Om, Zeitler, E. (1976) Scanning electron microscopy 1976, vols. I and II. Ultramicroscopy, 1 (3). 389-390 doi:10.1016/0304-3991(76)90055-3

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Reference Type	Journal (article/letter/editorial)
Title	Scanning electron microscopy 1976, vols. I and II
Journal	Ultramicroscopy
Authors	Johari, Om		Author
Authors	Zeitler, E.		Author
Year	1976 (January)	Volume	1
Issue	3
Publisher	Elsevier BV
DOI	doi:10.1016/0304-3991(76)90055-3Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4889085	Long-form Identifier	mindat:1:5:4889085:2
GUID	0
Full Reference	Johari, Om, Zeitler, E. (1976) Scanning electron microscopy 1976, vols. I and II. Ultramicroscopy, 1 (3). 389-390 doi:10.1016/0304-3991(76)90055-3
Plain Text	Johari, Om, Zeitler, E. (1976) Scanning electron microscopy 1976, vols. I and II. Ultramicroscopy, 1 (3). 389-390 doi:10.1016/0304-3991(76)90055-3
In	(1976, January) Ultramicroscopy Vol. 1 (3) Elsevier BV

	*Crewe, A.V. (1976) Very low voltage electron microscopy. Ultramicroscopy, 1 (3). 267-269 doi:10.1016/0304-3991(76)90041-3*
	*Cowley, J.M. (1976) The extension of scanning transmission electron microscopy by use of diffraction information. Ultramicroscopy, 1 (3). 255-262 doi:10.1016/0304-3991(76)90039-5*
	*Cowley, J.M. (1976) Scanning transmission electron microscopy of thin specimens. Ultramicroscopy, 2. 3-16 doi:10.1016/s0304-3991(76)90161-3*
	*Marton, L. (1976) Early application of electron microscopy to biology. Ultramicroscopy, 1 (3). 281-296 doi:10.1016/0304-3991(76)90046-2*
	*Barth, J.E., Le Poole, J.B. (1976) Low voltage electron microscopy — how low?. Ultramicroscopy, 1 (3). 387-388 doi:10.1016/0304-3991(76)90054-1*
	*Mulvey, T. (1976) Report on EMAG75, a conference on developments in electron microscopy and analysis. Ultramicroscopy, 1 (3). 263-265 doi:10.1016/0304-3991(76)90040-1*
	*(1976) Announcement. Ultramicroscopy, 1 (3). 278pp. doi:10.1016/0304-3991(76)90044-9*
	*(1976) Announcement. Ultramicroscopy, 1 (3). 391pp. doi:10.1016/0304-3991(76)90056-5*
	Escovitz, W.H., Fox, T.R., Levi-Setti, R. (1976) Proton vs. electron scanning transmission microscopy: The ratio of elastic to inelastic cross-sections. Ultramicroscopy, 1 (3). 383-386 doi:10.1016/0304-3991(76)90053-x
	*Crewe, A.V., Lin, P.S.D. (1976) The use of backscattered electrons for imaging purposes in a scanning electron microscope. Ultramicroscopy, 1 (3). 231-238 doi:10.1016/0304-3991(76)90037-1*
	*Ganor, E. (1986) Electron microscopy in the study of air pollution. Ultramicroscopy, 19 (4). 389-390 doi:10.1016/0304-3991(86)90105-1*

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Johari, Om, Zeitler, E. (1976) Scanning electron microscopy 1976, vols. I and II. Ultramicroscopy, 1 (3). 389-390 doi:10.1016/0304-3991(76)90055-3

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