Smits, H.T.J., Linders, P.W.J., Stols, A.L.H., Stadhouders, A.M. (1982) A low background TEM specimen holder for quantitative X-ray microanalysis and simultaneous specimen current measurement. Ultramicroscopy, 9 (4). 412pp. doi:10.1016/0304-3991(82)90134-6
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | A low background TEM specimen holder for quantitative X-ray microanalysis and simultaneous specimen current measurement | ||
Journal | Ultramicroscopy | ||
Authors | Smits, H.T.J. | Author | |
Linders, P.W.J. | Author | ||
Stols, A.L.H. | Author | ||
Stadhouders, A.M. | Author | ||
Year | 1982 (January) | Volume | 9 |
Issue | 4 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0304-3991(82)90134-6Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4890663 | Long-form Identifier | mindat:1:5:4890663:0 |
GUID | 0 | ||
Full Reference | Smits, H.T.J., Linders, P.W.J., Stols, A.L.H., Stadhouders, A.M. (1982) A low background TEM specimen holder for quantitative X-ray microanalysis and simultaneous specimen current measurement. Ultramicroscopy, 9 (4). 412pp. doi:10.1016/0304-3991(82)90134-6 | ||
Plain Text | Smits, H.T.J., Linders, P.W.J., Stols, A.L.H., Stadhouders, A.M. (1982) A low background TEM specimen holder for quantitative X-ray microanalysis and simultaneous specimen current measurement. Ultramicroscopy, 9 (4). 412pp. doi:10.1016/0304-3991(82)90134-6 | ||
In | (1982, January) Ultramicroscopy Vol. 9 (4) Elsevier BV |
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