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Kilaas, Roar, O'Keefe, Michael A., Krishnan, Kannan M. (1987) On the inclusion of upper Laue layers in computational methods in high resolution transmission electron microscopy. Ultramicroscopy, 21 (1). 47-61 doi:10.1016/0304-3991(87)90006-4

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Reference TypeJournal (article/letter/editorial)
TitleOn the inclusion of upper Laue layers in computational methods in high resolution transmission electron microscopy
JournalUltramicroscopy
AuthorsKilaas, RoarAuthor
O'Keefe, Michael A.Author
Krishnan, Kannan M.Author
Year1987 (January)Volume21
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90006-4Search in ResearchGate
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Mindat Ref. ID4893193Long-form Identifiermindat:1:5:4893193:7
GUID0
Full ReferenceKilaas, Roar, O'Keefe, Michael A., Krishnan, Kannan M. (1987) On the inclusion of upper Laue layers in computational methods in high resolution transmission electron microscopy. Ultramicroscopy, 21 (1). 47-61 doi:10.1016/0304-3991(87)90006-4
Plain TextKilaas, Roar, O'Keefe, Michael A., Krishnan, Kannan M. (1987) On the inclusion of upper Laue layers in computational methods in high resolution transmission electron microscopy. Ultramicroscopy, 21 (1). 47-61 doi:10.1016/0304-3991(87)90006-4
In(1987, January) Ultramicroscopy Vol. 21 (1) Elsevier BV

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O'Keefe, Michael A. (1992) “Resolution” in high-resolution electron microscopy. Ultramicroscopy, 47 (1). 282-297 doi:10.1016/0304-3991(92)90203-v
Kilaas, R., Gronsky, R. (1985) The effect of amorphous surface layers on images of crystals in high resolution transmission electron microscopy. Ultramicroscopy, 16 (2). 193-201 doi:10.1016/0304-3991(85)90073-7
Kilaas, R., Gronsky, R. (1983) Real space image simulation in high resolution electron microscopy. Ultramicroscopy, 11 (4). 289-298 doi:10.1016/0304-3991(83)90008-6
Reimer, L., Ross-Messemer, M. (1987) Top-bottom effect in energy-selecting transmission electron microscopy. Ultramicroscopy, 21 (4). 385-387 doi:10.1016/0304-3991(87)90037-4
Giorgio, S., Kern, R. (1987) Defects in a lamellar polymer by high-resolution electron microscopy. Ultramicroscopy, 21 (2). 157-170 doi:10.1016/0304-3991(87)90082-9
Smith, David J., Saxton, W.O., O'Keefe, M.A., Wood, G.J., Stobbs, W.M. (1983) The importance of beam alignment and crystal tilt in high resolution electron microscopy. Ultramicroscopy, 11 (4). 263-281 doi:10.1016/0304-3991(83)90006-2
Kilaas, Roar, Radmilovic, Velimir (2001) Structure determination and structure refinement of Al2CuMg precipitates by quantitative high-resolution electron microscopy. Ultramicroscopy, 88 (1). 63-72 doi:10.1016/s0304-3991(00)00107-8
Zandbergen, H.W., Weyher, J., Van Landuyt, J. (1987) High resolution electron microscopy and photoetching on twins in GaAs. Ultramicroscopy, 21 (2). 207pp. doi:10.1016/0304-3991(87)90144-6
Sarikaya, Mehmet, Howe, James M. (1992) Resolution in conventional transmission electron microscopy. Ultramicroscopy, 47 (1). 145-161 doi:10.1016/0304-3991(92)90191-l
Krishnan, Kannan M. (1987) When is parallel illumination best for alchemi?. Ultramicroscopy, 23 (2). 199-203 doi:10.1016/0304-3991(87)90164-1
Krakow, William, Smith, David A. (1987) A high-resolution electron microscopy investigation of some low-angle and twin boundary structures. Ultramicroscopy, 22 (1). 47-55 doi:10.1016/0304-3991(87)90049-0
 
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