Reference Type | Journal (article/letter/editorial) |
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Title | Accelerating voltage and conductive coating thickness parameters in surface detail visualization in SEM |
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Journal | Ultramicroscopy |
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Authors | Havinga, P. | Author |
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Stokroos, I. | Author |
Dijk, F. | Author |
Year | 1987 (January) | Volume | 21 |
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Issue | 2 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0304-3991(87)90109-4Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4893273 | Long-form Identifier | mindat:1:5:4893273:2 |
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GUID | 0 |
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Full Reference | Havinga, P., Stokroos, I., Dijk, F. (1987) Accelerating voltage and conductive coating thickness parameters in surface detail visualization in SEM. Ultramicroscopy, 21 (2). 192-193 doi:10.1016/0304-3991(87)90109-4 |
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Plain Text | Havinga, P., Stokroos, I., Dijk, F. (1987) Accelerating voltage and conductive coating thickness parameters in surface detail visualization in SEM. Ultramicroscopy, 21 (2). 192-193 doi:10.1016/0304-3991(87)90109-4 |
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In | (1987, January) Ultramicroscopy Vol. 21 (2) Elsevier BV |
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