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Pennock, G.M., Schapink, F.W. (1987) Microstructure and etch pit correlation in a GaAs substrate. Ultramicroscopy, 21 (2). 200pp. doi:10.1016/0304-3991(87)90127-6

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Reference TypeJournal (article/letter/editorial)
TitleMicrostructure and etch pit correlation in a GaAs substrate
JournalUltramicroscopy
AuthorsPennock, G.M.Author
Schapink, F.W.Author
Year1987 (January)Volume21
Issue2
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90127-6Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4893314Long-form Identifiermindat:1:5:4893314:8
GUID0
Full ReferencePennock, G.M., Schapink, F.W. (1987) Microstructure and etch pit correlation in a GaAs substrate. Ultramicroscopy, 21 (2). 200pp. doi:10.1016/0304-3991(87)90127-6
Plain TextPennock, G.M., Schapink, F.W. (1987) Microstructure and etch pit correlation in a GaAs substrate. Ultramicroscopy, 21 (2). 200pp. doi:10.1016/0304-3991(87)90127-6
In(1987, January) Ultramicroscopy Vol. 21 (2) Elsevier BV

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Gat, R., Schapink, F.W. (1987) Convergent-beam electron diffraction from GaAs/AlAs superlattices. Ultramicroscopy, 21 (4). 389-392 doi:10.1016/0304-3991(87)90038-6
Otten, MaxT. (1987) The Alchemi technique: Its applications and limitations. Ultramicroscopy, 21 (2). 200pp. doi:10.1016/0304-3991(87)90126-4
Bons, A.J., Tang, X., Schapink, F.W. (1989) Defects in Si-doped GaAs grown by MOCVD. Ultramicroscopy, 27 (2). 198pp. doi:10.1016/0304-3991(89)90095-8
Gong, H., Schapink, F.W. (1989) Computer simulation and quantitative analysis of Holz discs in CBED patterns from GaAs/AlAs superlattices. Ultramicroscopy, 27 (2). 205pp. doi:10.1016/0304-3991(89)90116-2
Schapink, F.W. (1982) Dislocation networks in grain boundaries. Ultramicroscopy, 9 (4). 406-407 doi:10.1016/0304-3991(82)90125-5
Gong, H., Schapink, F.W. (1991) Fine details in satellite HOLZ reflection discs of CBED from a GaAs/AlAs multilayer. Ultramicroscopy, 35 (3). 171-184 doi:10.1016/0304-3991(91)90070-m
Zandbergen, H.W., Weyher, J., Van Landuyt, J. (1987) High resolution electron microscopy and photoetching on twins in GaAs. Ultramicroscopy, 21 (2). 207pp. doi:10.1016/0304-3991(87)90144-6
(1987) Special announcement. Ultramicroscopy, 21 (2). 179pp. doi:10.1016/0304-3991(87)90084-2
Schapink, F.W. (1988) Convergent-beam electron diffraction: Principle and some applications. Ultramicroscopy, 24 (4). 446pp. doi:10.1016/0304-3991(88)90195-7
Gong, H., Schapink, F.W. (1992) Foil-thickness determination from zone-axis CBED patterns and TEM images for a GaAs/AlAs multilayer in plan view. Ultramicroscopy, 41 (4). 375-385 doi:10.1016/0304-3991(92)90217-8
Hamelink, J.J.C., Schapink, F.W. (1984) Migration of near CSL boundaries in Au bicrystals. Ultramicroscopy, 14 (4). 395pp. doi:10.1016/0304-3991(84)90266-3
 
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