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Kuan, T.S. (1987) High resolution imaging of crystalline materials. Ultramicroscopy, 23 (2). 232pp. doi:10.1016/0304-3991(87)90171-9

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Reference TypeJournal (article/letter/editorial)
TitleHigh resolution imaging of crystalline materials
JournalUltramicroscopy
AuthorsKuan, T.S.Author
Year1987 (January)Volume23
Issue2
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90171-9Search in ResearchGate
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Mindat Ref. ID4893559Long-form Identifiermindat:1:5:4893559:9
GUID0
Full ReferenceKuan, T.S. (1987) High resolution imaging of crystalline materials. Ultramicroscopy, 23 (2). 232pp. doi:10.1016/0304-3991(87)90171-9
Plain TextKuan, T.S. (1987) High resolution imaging of crystalline materials. Ultramicroscopy, 23 (2). 232pp. doi:10.1016/0304-3991(87)90171-9
In(1987, January) Ultramicroscopy Vol. 23 (2) Elsevier BV

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Chiu, W., Jeng, T.-W., Degn, L.L., Crant, R., Schmid, M.F., Prasad, B.V.V. (1987) High resolution cryo-electron microscopy of biological specimens. Ultramicroscopy, 23 (2). 232pp. doi:10.1016/0304-3991(87)90172-0
Liu, J., Cowley, J.M. (1987) High-resolution scanning electron microscopy of surface reactions. Ultramicroscopy, 23 (3). 463-472 doi:10.1016/0304-3991(87)90257-9
Fan, G.Y., Cowley, J.M. (1987) The simulation of high resolution images of amorphous thin films. Ultramicroscopy, 21 (2). 125-130 doi:10.1016/0304-3991(87)90079-9
Giorgio, S., Kern, R. (1987) Defects in a lamellar polymer by high-resolution electron microscopy. Ultramicroscopy, 21 (2). 157-170 doi:10.1016/0304-3991(87)90082-9
(1987) Subject index to volume 23. Ultramicroscopy, 23 (3). 476-478 doi:10.1016/0304-3991(87)90259-2
(1987) Editorial Board. Ultramicroscopy, 23 (1). doi:10.1016/0304-3991(87)90220-8
Siegmann, A., Hiltner, A. (1987) The chlorination mechanism of polyethylene crystals. Ultramicroscopy, 23 (2). 237pp. doi:10.1016/0304-3991(87)90185-9
Jeng, Tzyy-Wen, Chiu, Wah (1987) High resolution cryo system designed for JEM 100CX electron microscope. Ultramicroscopy, 23 (1). 61-66 doi:10.1016/0304-3991(87)90227-0
Sinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x
Kinsbron, E. (1987) Applications of scanning electron microscopy in VLSI integrated circuits. Ultramicroscopy, 23 (2). 231pp. doi:10.1016/0304-3991(87)90168-9
(1987) Colour illustrations. Ultramicroscopy, 23 (1). 1pp. doi:10.1016/0304-3991(87)90221-x
 
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