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Kang, Z.C., Eyring, L. (1987) Surface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystal. Ultramicroscopy, 23 (3). 275-281 doi:10.1016/0304-3991(87)90236-1

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Reference TypeJournal (article/letter/editorial)
TitleSurface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystal
JournalUltramicroscopy
AuthorsKang, Z.C.Author
Eyring, L.Author
Year1987 (January)Volume23
Issue3
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90236-1Search in ResearchGate
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Mindat Ref. ID4893677Long-form Identifiermindat:1:5:4893677:4
GUID0
Full ReferenceKang, Z.C., Eyring, L. (1987) Surface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystal. Ultramicroscopy, 23 (3). 275-281 doi:10.1016/0304-3991(87)90236-1
Plain TextKang, Z.C., Eyring, L. (1987) Surface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystal. Ultramicroscopy, 23 (3). 275-281 doi:10.1016/0304-3991(87)90236-1
In(1987, January) Ultramicroscopy Vol. 23 (3) Elsevier BV

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Kang, Z.C., Eyring, L., Smith, David J. (1987) Dynamic edge and surface processes in terbium oxide. Ultramicroscopy, 22 (1). 71-79 doi:10.1016/0304-3991(87)90051-9
Schweda, E., Eyring, L., Smith, Davud J. (1987) Structural transformation and chemical reduction of Pr24O44 induced by the electron beam during microscopical examination. Ultramicroscopy, 23 (3). 443-451 doi:10.1016/0304-3991(87)90255-5
Kang, Z.C., Eyring, L. (1993) Analysis of time-resolved, in-situ change in high-resolution electron microscopy. Ultramicroscopy, 52 (3). 377-382 doi:10.1016/0304-3991(93)90049-4
Liu, J., Cowley, J.M. (1987) High-resolution scanning electron microscopy of surface reactions. Ultramicroscopy, 23 (3). 463-472 doi:10.1016/0304-3991(87)90257-9
Goral, J.P., Holladay, A., Eyring, L. (1985) Time-resolved analysis of high-resolution electron microscope images. Ultramicroscopy, 18 (1). 275-279 doi:10.1016/0304-3991(85)90143-3
Sinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x
Sharma, Renu, Barry, John, Eyring, LeRoy (1987) Electron-induced decomposition of rubidium chromium fluoride. Ultramicroscopy, 23 (3). 453-461 doi:10.1016/0304-3991(87)90256-7
Giorgio, S., Kern, R. (1987) Defects in a lamellar polymer by high-resolution electron microscopy. Ultramicroscopy, 21 (2). 157-170 doi:10.1016/0304-3991(87)90082-9
Eyring, LeRoy (1982) The role of high-resolution electron microscopy in the development of solid state chemistry. Ultramicroscopy, 8 (1). 39-58 doi:10.1016/0304-3991(82)90275-3
Merkle, Karl L. (1992) Quantification of atomic-scale grain boundary parameters by high-resolution electron microscopy. Ultramicroscopy, 40 (3). 281-290 doi:10.1016/0304-3991(92)90125-4
Treacy, M.M.J., Newsam, J.M. (1987) Electron beam sensitivity of zeolite L. Ultramicroscopy, 23 (3). 411-419 doi:10.1016/0304-3991(87)90252-x
 
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