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Mitchell, D.R.G. (2008) DiffTools: Electron diffraction software tools for DigitalMicrograph™. Microscopy Research and Technique, 71 (8). 588-593 doi:10.1002/jemt.20591

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Reference TypeJournal (article/letter/editorial)
TitleDiffTools: Electron diffraction software tools for DigitalMicrograph™
JournalMicroscopy Research and Technique
AuthorsMitchell, D.R.G.Author
Year2008 (August)Volume71
Issue8
PublisherWiley
DOIdoi:10.1002/jemt.20591Search in ResearchGate
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Mindat Ref. ID4955251Long-form Identifiermindat:1:5:4955251:5
GUID0
Full ReferenceMitchell, D.R.G. (2008) DiffTools: Electron diffraction software tools for DigitalMicrograph™. Microscopy Research and Technique, 71 (8). 588-593 doi:10.1002/jemt.20591
Plain TextMitchell, D.R.G. (2008) DiffTools: Electron diffraction software tools for DigitalMicrograph™. Microscopy Research and Technique, 71 (8). 588-593 doi:10.1002/jemt.20591
In(2008, August) Microscopy Research and Technique Vol. 71 (8) Wiley

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Mitchell, D.R.G., Petersen, T.C. (2012) RDFTools: A software tool for quantifying short-range ordering in amorphous materials. Microscopy Research and Technique, 75 (2). 153-163 doi:10.1002/jemt.21038
Mitchell, D.R.G. (2008) Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph™. Ultramicroscopy, 108 (4). 367-374 doi:10.1016/j.ultramic.2007.06.003
Mitchell, D.R.G., Schaffer, B. (2005) Scripting-customised microscopy tools for Digital Micrograph™. Ultramicroscopy, 103 (4). 319-332 doi:10.1016/j.ultramic.2005.02.003
Hou, VDH (2008) A DigitalMicrograph™ Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM. Microscopy and Microanalysis, 14. 1124-1125 doi:10.1017/s1431927608081452
Mitchell, David R. G. (2022) A script‐based method for achieving distortion‐free selected area electron diffraction. Microscopy Research and Technique, 85 (7) 2708-2713 doi:10.1002/jemt.24124
Hou, Vincent (2004) A DigitalMicrograph™ Script for Crystal Thickness Measurements Using Convergent Beam Electron Diffraction. Microscopy and Microanalysis, 10. 1380-1381 doi:10.1017/s1431927604881637
Mitchell, T. E. (1988) Foreword. Journal of Electron Microscopy Technique, 8 (3). 245 doi:10.1002/jemt.1060080302
Iakoubovskii, K., Mitsuishi, K., Nakayama, Y., Furuya, K. (2008) Thickness measurements with electron energy loss spectroscopy. Microscopy Research and Technique, 71 (8). 626-631 doi:10.1002/jemt.20597
Mitchell, T. E. (1988) Electron microscopy of ceramic superconductors: A bibliography. Journal of Electron Microscopy Technique, 8 (3). 339-341 doi:10.1002/jemt.1060080313
Uroukov, Ivan S., Patton, David (2008) Optimizing environmental scanning electron microscopy of spheroidal reaggregated neuronal cultures. Microscopy Research and Technique, 71 (11). 792-801 doi:10.1002/jemt.20621
Cavallotti, Carlo, D'Andrea, Vito, Tonnarini, Gianfranco, Cavallotti, Chiara, Bruzzone, Paolo (2008) Age-related changes in the human thymus studied with scanning electron microscopy. Microscopy Research and Technique, 71 (8). 573-578 doi:10.1002/jemt.20588
 
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