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Schwuttke, G. H., Howard, J. K. (1969) Reply to Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''. Journal of Applied Physics, 40 (4). 1972 doi:10.1063/1.1657878

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Reference TypeJournal (article/letter/editorial)
TitleReply to Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''
JournalJournal of Applied Physics
AuthorsSchwuttke, G. H.Author
Howard, J. K.Author
Year1969 (March 15)Volume40
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.1657878Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4958051Long-form Identifiermindat:1:5:4958051:8
GUID0
Full ReferenceSchwuttke, G. H., Howard, J. K. (1969) Reply to Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''. Journal of Applied Physics, 40 (4). 1972 doi:10.1063/1.1657878
Plain TextSchwuttke, G. H., Howard, J. K. (1969) Reply to Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''. Journal of Applied Physics, 40 (4). 1972 doi:10.1063/1.1657878
In(1969, March) Journal of Applied Physics Vol. 40 (4) AIP Publishing

See Also

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Schwuttke, G. H., Howard, J. K. (1968) X‐Ray Stress Topography of Thin Films on Germanium and Silicon. Journal of Applied Physics, 39 (3). 1581-1591 doi:10.1063/1.1656399
Segmüller, Armin, Light, T. B. (1969) Comment on ``X‐Ray Stress Topography of Thin Films on Germanium''. Journal of Applied Physics, 40 (4). 1972 doi:10.1063/1.1657877
van Mellaert, L. J., Schwuttke, G. H. (1972) Feedback Control Scheme for Scanning X‐Ray Topography. Journal of Applied Physics, 43 (2). 687-692 doi:10.1063/1.1661177
Schwuttke, G. H. (1962) X‐Ray Observations of Partial Dislocations in Epitaxial Silicon Films. Journal of Applied Physics, 33 (4). 1538-1540 doi:10.1063/1.1728768
Sawley, K J, Cliff, G, Howarth, C W (1978) Reply to "Comment on X-ray microanalysis of thin Al-Ag foils". Journal of Physics D: Applied Physics, 11. doi:10.1088/0022-3727/11/5/302
Schwuttke, G. H., Queisser, H. J. (1962) X‐Ray Observations of Diffusion‐Induced Dislocations in Silicon. Journal of Applied Physics, 33 (4). 1540-1542 doi:10.1063/1.1728769
Jungbluth, E. D. (1967) Reply to ``On X‐Ray Diffraction‐Contrast Reversal in Reflection Topography''. Journal of Applied Physics, 38 (9). 3786 doi:10.1063/1.1710213
de Klerk, J. (1969) Author's Reply to ``Piezoelectricity in Polycrystalline 6 mm Films'' by D. Berlincourt and H. Jaffe [40, 4683 (1969)]. Journal of Applied Physics, 40 (13). 5396 doi:10.1063/1.1657404
Belt, Roger F. (1969) Etching and X‐Ray Topography of Flux‐Grown Magnetic Garnets. Journal of Applied Physics, 40 (4). 1644-1651 doi:10.1063/1.1657826
Amalnerkar, D. P., Badrinarayanan, S., Date, S. K., Sinha, A. P. B. (1983) Reply to ‘‘Comment on ‘X‐ray photoelectron spectroscopic studies of oxygen chemisorption on thick films of photoconducting cadmium sulphide’ ’’. Journal of Applied Physics, 54 (5). 2881-2882 doi:10.1063/1.332287
Croset, M., Velasco, G. (1972) Structure and Composition of Sputtered Tantalum Thin Films on Silicon Studied by Nuclear and X‐Ray Analysis. Journal of Applied Physics, 43 (4). 1444-1448 doi:10.1063/1.1661339
 
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