Iijima, Sumio (1971) High‐Resolution Electron Microscopy of Crystal Lattice of Titanium‐Niobium Oxide. Journal of Applied Physics, 42 (13). 5891-5893 doi:10.1063/1.1660042
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | High‐Resolution Electron Microscopy of Crystal Lattice of Titanium‐Niobium Oxide | ||
Journal | Journal of Applied Physics | ||
Authors | Iijima, Sumio | Author | |
Year | 1971 (December) | Volume | 42 |
Issue | 13 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1660042Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4966863 | Long-form Identifier | mindat:1:5:4966863:0 |
GUID | 0 | ||
Full Reference | Iijima, Sumio (1971) High‐Resolution Electron Microscopy of Crystal Lattice of Titanium‐Niobium Oxide. Journal of Applied Physics, 42 (13). 5891-5893 doi:10.1063/1.1660042 | ||
Plain Text | Iijima, Sumio (1971) High‐Resolution Electron Microscopy of Crystal Lattice of Titanium‐Niobium Oxide. Journal of Applied Physics, 42 (13). 5891-5893 doi:10.1063/1.1660042 | ||
In | (1971, December) Journal of Applied Physics Vol. 42 (13) AIP Publishing |
See Also
These are possibly similar items as determined by title/reference text matching only.
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() | |
![]() |