Reference Type | Journal (article/letter/editorial) |
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Title | Lower Critical Field Measurements in NbN Bulk and Thin Films |
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Journal | Journal of Applied Physics |
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Authors | Mathur, M. P. | Author |
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Deis, D. W. | Author |
Gavaler, J. R. | Author |
Year | 1972 (July) | Volume | 43 |
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Issue | 7 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1661678Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4973500 | Long-form Identifier | mindat:1:5:4973500:2 |
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GUID | 0 |
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Full Reference | Mathur, M. P., Deis, D. W., Gavaler, J. R. (1972) Lower Critical Field Measurements in NbN Bulk and Thin Films. Journal of Applied Physics, 43 (7). 3158-3161 doi:10.1063/1.1661678 |
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Plain Text | Mathur, M. P., Deis, D. W., Gavaler, J. R. (1972) Lower Critical Field Measurements in NbN Bulk and Thin Films. Journal of Applied Physics, 43 (7). 3158-3161 doi:10.1063/1.1661678 |
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In | (1972, July) Journal of Applied Physics Vol. 43 (7) AIP Publishing |
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