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Yablon, Dalia, Libera, Matthew (2019) Microscopy 101: Scanning Probes or Scanning Electrons: A Practical Guide to Select a Method for Nanoscale Characterization. Microscopy Today, 27 (6). 32-38 doi:10.1017/s1551929519001044

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Reference TypeJournal (article/letter/editorial)
TitleMicroscopy 101: Scanning Probes or Scanning Electrons: A Practical Guide to Select a Method for Nanoscale Characterization
JournalMicroscopy Today
AuthorsYablon, DaliaAuthor
Libera, MatthewAuthor
Year2019 (November)Volume27
Issue6
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1551929519001044Search in ResearchGate
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Mindat Ref. ID4977265Long-form Identifiermindat:1:5:4977265:0
GUID0
Full ReferenceYablon, Dalia, Libera, Matthew (2019) Microscopy 101: Scanning Probes or Scanning Electrons: A Practical Guide to Select a Method for Nanoscale Characterization. Microscopy Today, 27 (6). 32-38 doi:10.1017/s1551929519001044
Plain TextYablon, Dalia, Libera, Matthew (2019) Microscopy 101: Scanning Probes or Scanning Electrons: A Practical Guide to Select a Method for Nanoscale Characterization. Microscopy Today, 27 (6). 32-38 doi:10.1017/s1551929519001044
In(2019, November) Microscopy Today Vol. 27 (6) Cambridge University Press (CUP)

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Anderson, Geoffrey (2013) Scanning Microwave Microscopy for Nanoscale Electrical Characterization. Microscopy Today, 21 (6). 32-36 doi:10.1017/s1551929513000965
Taylor, Gene (1998) Scintillators for the SEM - A Practical Guide. Microscopy Today, 6 (6). 26-27 doi:10.1017/s155192950006819x
Phillips, P.J., De Graef, M., Mills, M.J. (2012) A Practical Guide to Bright/Dark Field Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1964-1965 doi:10.1017/s1431927612011671
Kalinin, Sergei V., Bonnell, Dawn A. (2002) Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images. Microscopy Today, 10 (1). 22-27 doi:10.1017/s1551929500050471
Plumley, William C., Kostrna, Michael, Goodman, Steven L. (2019) Cryo-Planing Biological Specimens for Scanning Electron Microscopy. Microscopy Today, 27 (2). 20-25 doi:10.1017/s1551929518001451
Todd, Brian A., Eppell, Steven J. (2002) Lateral Resolution in Scanning Force Microscopy. Microscopy Today, 10 (3). 32 doi:10.1017/s1551929500058041
Yaniv, Daphna R., Ramakrishna, B.L., Glaunsinger, William S. (1994) Scanning Probe Microscopy: A Rapidly Emerging Instrumental Method. Microscopy Today, 2 (6). 16-17 doi:10.1017/s1551929500066517
Bippes, Christian, Frederix, Patrick, Werten, Paul, Yablon, Dalia (2017) CoreAFM: Research-Grade AFM Platform with Application Modularity. Microscopy Today, 25 (6). 20-25 doi:10.1017/s1551929517000992
Jacobs, Tevis D. B., Wabiszewski, Graham E., Goodman, Alexander J., Carpick, Robert W. (2016) Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide. Review of Scientific Instruments, 87 (1). 13703pp. doi:10.1063/1.4937810
McMillan, William (1998) Laser Scanning Confocal Microscopy for Materials Science. Microscopy Today, 6 (5). 20-23 doi:10.1017/s1551929500067791
Lewis, Aaron, Komissar, A., Ignatov, A., Fedoroyov, Oleg, Maayan, E., Yablon, Dalia, Taha, H. (2013) AFM Integrated with SEM and FIB: A Synergistic Union. Microscopy Today, 21 (6). 26-31 doi:10.1017/s1551929513001090
 
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