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Yamamoto, Kazuo, Hirayama, Tsukasa, Tanji, Takayoshi (2013) Development of advanced electron holographic techniques and application to industrial materials and devices. Microscopy, 62. doi:10.1093/jmicro/dft006

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Reference TypeJournal (article/letter/editorial)
TitleDevelopment of advanced electron holographic techniques and application to industrial materials and devices
JournalMicroscopy
AuthorsYamamoto, KazuoAuthor
Hirayama, TsukasaAuthor
Tanji, TakayoshiAuthor
Year2013 (June)Volume62
PublisherOxford University Press (OUP)
DOIdoi:10.1093/jmicro/dft006Search in ResearchGate
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Mindat Ref. ID4983367Long-form Identifiermindat:1:5:4983367:8
GUID0
Full ReferenceYamamoto, Kazuo, Hirayama, Tsukasa, Tanji, Takayoshi (2013) Development of advanced electron holographic techniques and application to industrial materials and devices. Microscopy, 62. doi:10.1093/jmicro/dft006
Plain TextYamamoto, Kazuo, Hirayama, Tsukasa, Tanji, Takayoshi (2013) Development of advanced electron holographic techniques and application to industrial materials and devices. Microscopy, 62. doi:10.1093/jmicro/dft006
In(2013) Microscopy Vol. 62. Oxford University Press (OUP)

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Hirayama, Tsukasa, Yamamoto, Kazuo, Tanji, Takayoshi (2004) Single and Multi–Magnetic Domain Structures Studied by Electron Holography and Lorentz Microscopy. Microscopy and Microanalysis, 10. 500-501 doi:10.1017/s1431927604881388
Nomura, Yuki, Yamamoto, Kazuo, Hirayama, Tsukasa, Saitoh, Koh (2018) Electric shielding films for biased TEM samples and their application to in situ electron holography. Microscopy, 67 (3). 178-186 doi:10.1093/jmicro/dfy018
Yamamoto, Kazuo, Hirayama, Tsukasa, Tanji, Takayoshi (2004) Off-axis electron holography without Fresnel fringes. Ultramicroscopy, 101 (2). 265-269 doi:10.1016/j.ultramic.2004.07.001
Watanabe, Masashi (2013) Microscopy Hacks: development of various techniques to assist quantitative nanoanalysis and advanced electron microscopy. Microscopy, 62 (2). 217-241 doi:10.1093/jmicro/dfs085
Nomura, Yuki, Anada, Satoshi, Hirayama, Tsukasa, Igaki, Emiko, Yamamoto, Kazuo (2019) SM-4 Noise Reduction of Electron Holograms via Sparse Coding. Microscopy, 68. doi:10.1093/jmicro/dfz057
Lai, Guanming, Hirayama, Tsukasa, Ishizuka, Kazuo, Tanji, Takayoshi, Tonomura, Akira (1994) Three-dimensional reconstruction of electric-potential distribution in electron-holographic interferometry. Applied Optics, 33. 829pp. doi:10.1364/ao.33.000829
Tanji, Takayoshi, Maeda, Masahiro, Ishigure, Nobuo, Aoyama, Naoto, Yamamoto, Kazuo, Hirayama, Tsukasa (1999) Lorentz Microscopy of Magnetic Granular Films. Physical Review Letters, 83 (5). 1038-1041 doi:10.1103/physrevlett.83.1038
Li, Wei, Zhang, Jianhui, Tanji, Takayoshi (2013) Image processing for phase imperfections in electron holography. Microscopy, 62 (6). 583-588 doi:10.1093/jmicro/dft034
Nomura, Yuki, Yamamoto, Kazuo, Anada, Satoshi, Hirayama, Tsukasa, Igaki, Emiko, Saitoh, Koh (2021) Denoising of series electron holograms using tensor decomposition. Microscopy, 70 (3) 255-264 doi:10.1093/jmicro/dfaa057
Yamamoto, Kazuo, Hirayama, Tsukasa, Tanji, Takayoshi, Hibino, Michio (2003) Evaluation of high-precision phase-shifting electron holography by using hologram simulation. Surface and Interface Analysis, 35 (1). 60-65 doi:10.1002/sia.1494
Sasaki, Hirokazu, Otomo, Shinya, Minato, Ryuichiro, Yamamoto, Kazuo, Hirayama, Tsukasa (2014) Direct observation of dopant distribution in GaAs compound semiconductors using phase-shifting electron holography and Lorentz microscopy. Microscopy, 63 (3). 235-242 doi:10.1093/jmicro/dfu008
 
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