Reference Type | Journal (article/letter/editorial) |
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Title | Transmission electron microscopy of (001) ZnTe on (001) GaAs grown by molecular‐beam epitaxy |
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Journal | Journal of Applied Physics |
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Authors | Petruzzello, J. | Author |
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Olego, D. J. | Author |
Chu, X. | Author |
Faurie, J. P. | Author |
Year | 1988 (March) | Volume | 63 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.339920Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5034265 | Long-form Identifier | mindat:1:5:5034265:9 |
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GUID | 0 |
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Full Reference | Petruzzello, J., Olego, D. J., Chu, X., Faurie, J. P. (1988) Transmission electron microscopy of (001) ZnTe on (001) GaAs grown by molecular‐beam epitaxy. Journal of Applied Physics, 63 (5). 1783-1785 doi:10.1063/1.339920 |
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Plain Text | Petruzzello, J., Olego, D. J., Chu, X., Faurie, J. P. (1988) Transmission electron microscopy of (001) ZnTe on (001) GaAs grown by molecular‐beam epitaxy. Journal of Applied Physics, 63 (5). 1783-1785 doi:10.1063/1.339920 |
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In | (1988, March) Journal of Applied Physics Vol. 63 (5) AIP Publishing |
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