Flemish, J. R., Shen, H., Jones, K. A., Dutta, M., Ban, V. S. (1991) Determination of the composition of strained InGaAsP layers on InP substrates using photoreflectance and double‐crystal x‐ray diffractometry. Journal of Applied Physics, 70 (4). 2152-2155 doi:10.1063/1.349452
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Determination of the composition of strained InGaAsP layers on InP substrates using photoreflectance and double‐crystal x‐ray diffractometry | ||
Journal | Journal of Applied Physics | ||
Authors | Flemish, J. R. | Author | |
Shen, H. | Author | ||
Jones, K. A. | Author | ||
Dutta, M. | Author | ||
Ban, V. S. | Author | ||
Year | 1991 (August 15) | Volume | 70 |
Issue | 4 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.349452Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5055257 | Long-form Identifier | mindat:1:5:5055257:5 |
GUID | 0 | ||
Full Reference | Flemish, J. R., Shen, H., Jones, K. A., Dutta, M., Ban, V. S. (1991) Determination of the composition of strained InGaAsP layers on InP substrates using photoreflectance and double‐crystal x‐ray diffractometry. Journal of Applied Physics, 70 (4). 2152-2155 doi:10.1063/1.349452 | ||
Plain Text | Flemish, J. R., Shen, H., Jones, K. A., Dutta, M., Ban, V. S. (1991) Determination of the composition of strained InGaAsP layers on InP substrates using photoreflectance and double‐crystal x‐ray diffractometry. Journal of Applied Physics, 70 (4). 2152-2155 doi:10.1063/1.349452 | ||
In | (1991, August) Journal of Applied Physics Vol. 70 (4) AIP Publishing |
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