Reference Type | Journal (article/letter/editorial) |
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Title | Interdiffusion study of amorphous Ni–Si multilayer at low temperature |
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Journal | Journal of Applied Physics |
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Authors | Wang, W. H. | Author |
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Bai, H. Y. | Author |
Wang, W. K. | Author |
Year | 1993 (August 15) | Volume | 74 |
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Issue | 4 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.354684Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5065237 | Long-form Identifier | mindat:1:5:5065237:0 |
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GUID | 0 |
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Full Reference | Wang, W. H., Bai, H. Y., Wang, W. K. (1993) Interdiffusion study of amorphous Ni–Si multilayer at low temperature. Journal of Applied Physics, 74 (4). 2471-2474 doi:10.1063/1.354684 |
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Plain Text | Wang, W. H., Bai, H. Y., Wang, W. K. (1993) Interdiffusion study of amorphous Ni–Si multilayer at low temperature. Journal of Applied Physics, 74 (4). 2471-2474 doi:10.1063/1.354684 |
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In | (1993, August) Journal of Applied Physics Vol. 74 (4) AIP Publishing |
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