Reference Type | Journal (article/letter/editorial) |
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Title | Subband structure and ionized impurity scattering of the two dimensional electron gas in δ‐doped field effect transistor |
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Journal | Journal of Applied Physics |
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Authors | Fu, Y. | Author |
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Willander, M. | Author |
Year | 1995 (September) | Volume | 78 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.359984Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5076439 | Long-form Identifier | mindat:1:5:5076439:2 |
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GUID | 0 |
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Full Reference | Fu, Y., Willander, M. (1995) Subband structure and ionized impurity scattering of the two dimensional electron gas in δ‐doped field effect transistor. Journal of Applied Physics, 78 (5). 3504-3510 doi:10.1063/1.359984 |
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Plain Text | Fu, Y., Willander, M. (1995) Subband structure and ionized impurity scattering of the two dimensional electron gas in δ‐doped field effect transistor. Journal of Applied Physics, 78 (5). 3504-3510 doi:10.1063/1.359984 |
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In | (1995, September) Journal of Applied Physics Vol. 78 (5) AIP Publishing |
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